Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection
In this study, we assess the efficacy of multiple generations of electron detectors for cross-correlation-based analysis using a single crystal Si sample as a reference. We show that, while improvements in precision are modest, there have been significant gains in the rate at which high-quality diffraction patterns can be collected. This has important implications in the size of datasets that can be collected and reduces the impact of drift and sample contamination.PMID:38141535 | DOI:10.1016/j.ultramic.2023.113913 (Source: Ultramicroscopy)
Source: Ultramicroscopy - December 23, 2023 Category: Laboratory Medicine Authors: Josephine DeRonja Matthew Nowell Stuart Wright Josh Kacher Source Type: research
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection
In this study, we assess the efficacy of multiple generations of electron detectors for cross-correlation-based analysis using a single crystal Si sample as a reference. We show that, while improvements in precision are modest, there have been significant gains in the rate at which high-quality diffraction patterns can be collected. This has important implications in the size of datasets that can be collected and reduces the impact of drift and sample contamination.PMID:38141535 | DOI:10.1016/j.ultramic.2023.113913 (Source: Ultramicroscopy)
Source: Ultramicroscopy - December 23, 2023 Category: Laboratory Medicine Authors: Josephine DeRonja Matthew Nowell Stuart Wright Josh Kacher Source Type: research
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection
In this study, we assess the efficacy of multiple generations of electron detectors for cross-correlation-based analysis using a single crystal Si sample as a reference. We show that, while improvements in precision are modest, there have been significant gains in the rate at which high-quality diffraction patterns can be collected. This has important implications in the size of datasets that can be collected and reduces the impact of drift and sample contamination.PMID:38141535 | DOI:10.1016/j.ultramic.2023.113913 (Source: Ultramicroscopy)
Source: Ultramicroscopy - December 23, 2023 Category: Laboratory Medicine Authors: Josephine DeRonja Matthew Nowell Stuart Wright Josh Kacher Source Type: research
Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environment
In this study, we propose the optimal design and condition of a conical Electrostatic Objective Lens (EOL) for a UHV LV-SEM to achieve the high spatial resolution and secondary electron (SE) detection efficiency. The EOL is composed of only the three electrodes (retarding, focusing and booster electrodes) and the insulators, which is suitable for maintaining a UHV environment with less out-gassing. The cone angle of the EOL is determined as 60° to integrate a spectrometer in the UHV LV-SEM and in a large size and a higher tilt angle of the sample. Through the optimization with the simulations, the EOL achieves the minimiz...
Source: Ultramicroscopy - December 22, 2023 Category: Laboratory Medicine Authors: Jeong-Woong Lee In-Yong Park Takashi Ogawa Source Type: research
Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environment
In this study, we propose the optimal design and condition of a conical Electrostatic Objective Lens (EOL) for a UHV LV-SEM to achieve the high spatial resolution and secondary electron (SE) detection efficiency. The EOL is composed of only the three electrodes (retarding, focusing and booster electrodes) and the insulators, which is suitable for maintaining a UHV environment with less out-gassing. The cone angle of the EOL is determined as 60° to integrate a spectrometer in the UHV LV-SEM and in a large size and a higher tilt angle of the sample. Through the optimization with the simulations, the EOL achieves the minimiz...
Source: Ultramicroscopy - December 22, 2023 Category: Laboratory Medicine Authors: Jeong-Woong Lee In-Yong Park Takashi Ogawa Source Type: research
Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environment
In this study, we propose the optimal design and condition of a conical Electrostatic Objective Lens (EOL) for a UHV LV-SEM to achieve the high spatial resolution and secondary electron (SE) detection efficiency. The EOL is composed of only the three electrodes (retarding, focusing and booster electrodes) and the insulators, which is suitable for maintaining a UHV environment with less out-gassing. The cone angle of the EOL is determined as 60° to integrate a spectrometer in the UHV LV-SEM and in a large size and a higher tilt angle of the sample. Through the optimization with the simulations, the EOL achieves the minimiz...
Source: Ultramicroscopy - December 22, 2023 Category: Laboratory Medicine Authors: Jeong-Woong Lee In-Yong Park Takashi Ogawa Source Type: research
Does the order of elastic and inelastic scattering affect an image or is there a top bottom effect from inelastic scattering?
Ultramicroscopy. 2023 Dec 14;257:113890. doi: 10.1016/j.ultramic.2023.113890. Online ahead of print.ABSTRACTEspecially for light elements inelastic scattering is more probable than the elastic scattering that conveys the structural information. The question arises as to whether an image using inelastically scattered electrons is different depending on whether the elastic or inelastic scattering happens first, is there a top-bottom effect. We show that since inelastic scattering is concentrated in a narrow range of angles, much less than typical Bragg angles in light element materials, the inelastic and elastic processes ar...
Source: Ultramicroscopy - December 19, 2023 Category: Laboratory Medicine Authors: Peter Rez Source Type: research
Does the order of elastic and inelastic scattering affect an image or is there a top bottom effect from inelastic scattering?
Ultramicroscopy. 2023 Dec 14;257:113890. doi: 10.1016/j.ultramic.2023.113890. Online ahead of print.ABSTRACTEspecially for light elements inelastic scattering is more probable than the elastic scattering that conveys the structural information. The question arises as to whether an image using inelastically scattered electrons is different depending on whether the elastic or inelastic scattering happens first, is there a top-bottom effect. We show that since inelastic scattering is concentrated in a narrow range of angles, much less than typical Bragg angles in light element materials, the inelastic and elastic processes ar...
Source: Ultramicroscopy - December 19, 2023 Category: Laboratory Medicine Authors: Peter Rez Source Type: research
Does the order of elastic and inelastic scattering affect an image or is there a top bottom effect from inelastic scattering?
Ultramicroscopy. 2023 Dec 14;257:113890. doi: 10.1016/j.ultramic.2023.113890. Online ahead of print.ABSTRACTEspecially for light elements inelastic scattering is more probable than the elastic scattering that conveys the structural information. The question arises as to whether an image using inelastically scattered electrons is different depending on whether the elastic or inelastic scattering happens first, is there a top-bottom effect. We show that since inelastic scattering is concentrated in a narrow range of angles, much less than typical Bragg angles in light element materials, the inelastic and elastic processes ar...
Source: Ultramicroscopy - December 19, 2023 Category: Laboratory Medicine Authors: Peter Rez Source Type: research
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy
Ultramicroscopy. 2023 Dec 5;257:113903. doi: 10.1016/j.ultramic.2023.113903. Online ahead of print.ABSTRACTTri-beam microscopes comprising a fs-laser beam, a Xe+ plasma focused ion beam (PFIB) and an electron beam all in one chamber open up exciting opportunities for site-specific correlative microscopy. They offer the possibility of rapid ablation and material removal by fs-laser, subsequent polishing by Xe-PFIB milling and electron imaging of the same area. While tri-beam systems are capable of probing large (mm) volumes providing high resolution microscopical characterisation of 2D and 3D images across exceptionally wid...
Source: Ultramicroscopy - December 15, 2023 Category: Laboratory Medicine Authors: A Gholinia J Donoghue A Garner M Curd M J Lawson B Winiarski R Geurts P J Withers T L Burnett Source Type: research
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy
Ultramicroscopy. 2023 Dec 5;257:113903. doi: 10.1016/j.ultramic.2023.113903. Online ahead of print.ABSTRACTTri-beam microscopes comprising a fs-laser beam, a Xe+ plasma focused ion beam (PFIB) and an electron beam all in one chamber open up exciting opportunities for site-specific correlative microscopy. They offer the possibility of rapid ablation and material removal by fs-laser, subsequent polishing by Xe-PFIB milling and electron imaging of the same area. While tri-beam systems are capable of probing large (mm) volumes providing high resolution microscopical characterisation of 2D and 3D images across exceptionally wid...
Source: Ultramicroscopy - December 15, 2023 Category: Laboratory Medicine Authors: A Gholinia J Donoghue A Garner M Curd M J Lawson B Winiarski R Geurts P J Withers T L Burnett Source Type: research
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy
Ultramicroscopy. 2023 Dec 5;257:113903. doi: 10.1016/j.ultramic.2023.113903. Online ahead of print.ABSTRACTTri-beam microscopes comprising a fs-laser beam, a Xe+ plasma focused ion beam (PFIB) and an electron beam all in one chamber open up exciting opportunities for site-specific correlative microscopy. They offer the possibility of rapid ablation and material removal by fs-laser, subsequent polishing by Xe-PFIB milling and electron imaging of the same area. While tri-beam systems are capable of probing large (mm) volumes providing high resolution microscopical characterisation of 2D and 3D images across exceptionally wid...
Source: Ultramicroscopy - December 15, 2023 Category: Laboratory Medicine Authors: A Gholinia J Donoghue A Garner M Curd M J Lawson B Winiarski R Geurts P J Withers T L Burnett Source Type: research
The target region focused imaging method for scanning ion conductance microscopy
Ultramicroscopy. 2023 Dec 9;257:113910. doi: 10.1016/j.ultramic.2023.113910. Online ahead of print.ABSTRACTScanning ion conductance microscopy (SICM) has developed rapidly and has wide applications in biomedicine, single-cell science and other fields. SICM scanning speed is limited by the conventional raster-type scanning method, which spends most of time on imaging the substrate and does not focus enough on the target area. In order to solve this problem, a target region focused (TRF) method is proposed, which can effectively avoid the scanning of unnecessary substrate areas and enables SICM to image the target area only ...
Source: Ultramicroscopy - December 13, 2023 Category: Laboratory Medicine Authors: Shengbo Gu Jian Zhuang Tianying Wang Shiting Hu Weilun Song Xiaobo Liao Source Type: research
The target region focused imaging method for scanning ion conductance microscopy
Ultramicroscopy. 2023 Dec 9;257:113910. doi: 10.1016/j.ultramic.2023.113910. Online ahead of print.ABSTRACTScanning ion conductance microscopy (SICM) has developed rapidly and has wide applications in biomedicine, single-cell science and other fields. SICM scanning speed is limited by the conventional raster-type scanning method, which spends most of time on imaging the substrate and does not focus enough on the target area. In order to solve this problem, a target region focused (TRF) method is proposed, which can effectively avoid the scanning of unnecessary substrate areas and enables SICM to image the target area only ...
Source: Ultramicroscopy - December 13, 2023 Category: Laboratory Medicine Authors: Shengbo Gu Jian Zhuang Tianying Wang Shiting Hu Weilun Song Xiaobo Liao Source Type: research
The target region focused imaging method for scanning ion conductance microscopy
Ultramicroscopy. 2023 Dec 9;257:113910. doi: 10.1016/j.ultramic.2023.113910. Online ahead of print.ABSTRACTScanning ion conductance microscopy (SICM) has developed rapidly and has wide applications in biomedicine, single-cell science and other fields. SICM scanning speed is limited by the conventional raster-type scanning method, which spends most of time on imaging the substrate and does not focus enough on the target area. In order to solve this problem, a target region focused (TRF) method is proposed, which can effectively avoid the scanning of unnecessary substrate areas and enables SICM to image the target area only ...
Source: Ultramicroscopy - December 13, 2023 Category: Laboratory Medicine Authors: Shengbo Gu Jian Zhuang Tianying Wang Shiting Hu Weilun Song Xiaobo Liao Source Type: research
