Weld-free mounting of lamellae for electrical biasing operando TEM
This article delineates an improved FIB-based sample preparation methodology that results in good electrical connectivity and operational functionality across various MIM devices. To exemplify the efficacy of the sample preparation technique, we demonstrate preparation of a clean cross section extracted from a Au/Pt/BaSrTiO3/SrMoO3 tunable capacitor (varactor). The FIB-prepared TEM lamella mounted on a MEMS-based chip showed current levels in the tens of picoamperes range at 0.1 V. Furthermore, the electric response and current density of the TEM lamella device closely align with macro-scale devices. These samples exhibit ...
Source: Ultramicroscopy - February 24, 2024 Category: Laboratory Medicine Authors: Oscar Recalde-Benitez Yevheniy Pivak Tianshu Jiang Robert Winkler Alexander Zintler Esmaeil Adabifiroozjaei Philipp Komissinskiy Lambert Alff William A Hubbard H Hugo Perez-Garza Leopoldo Molina-Luna Source Type: research
Weld-free mounting of lamellae for electrical biasing operando TEM
This article delineates an improved FIB-based sample preparation methodology that results in good electrical connectivity and operational functionality across various MIM devices. To exemplify the efficacy of the sample preparation technique, we demonstrate preparation of a clean cross section extracted from a Au/Pt/BaSrTiO3/SrMoO3 tunable capacitor (varactor). The FIB-prepared TEM lamella mounted on a MEMS-based chip showed current levels in the tens of picoamperes range at 0.1 V. Furthermore, the electric response and current density of the TEM lamella device closely align with macro-scale devices. These samples exhibit ...
Source: Ultramicroscopy - February 24, 2024 Category: Laboratory Medicine Authors: Oscar Recalde-Benitez Yevheniy Pivak Tianshu Jiang Robert Winkler Alexander Zintler Esmaeil Adabifiroozjaei Philipp Komissinskiy Lambert Alff William A Hubbard H Hugo Perez-Garza Leopoldo Molina-Luna Source Type: research
Weld-free mounting of lamellae for electrical biasing operando TEM
This article delineates an improved FIB-based sample preparation methodology that results in good electrical connectivity and operational functionality across various MIM devices. To exemplify the efficacy of the sample preparation technique, we demonstrate preparation of a clean cross section extracted from a Au/Pt/BaSrTiO3/SrMoO3 tunable capacitor (varactor). The FIB-prepared TEM lamella mounted on a MEMS-based chip showed current levels in the tens of picoamperes range at 0.1 V. Furthermore, the electric response and current density of the TEM lamella device closely align with macro-scale devices. These samples exhibit ...
Source: Ultramicroscopy - February 24, 2024 Category: Laboratory Medicine Authors: Oscar Recalde-Benitez Yevheniy Pivak Tianshu Jiang Robert Winkler Alexander Zintler Esmaeil Adabifiroozjaei Philipp Komissinskiy Lambert Alff William A Hubbard H Hugo Perez-Garza Leopoldo Molina-Luna Source Type: research
Weld-free mounting of lamellae for electrical biasing operando TEM
This article delineates an improved FIB-based sample preparation methodology that results in good electrical connectivity and operational functionality across various MIM devices. To exemplify the efficacy of the sample preparation technique, we demonstrate preparation of a clean cross section extracted from a Au/Pt/BaSrTiO3/SrMoO3 tunable capacitor (varactor). The FIB-prepared TEM lamella mounted on a MEMS-based chip showed current levels in the tens of picoamperes range at 0.1 V. Furthermore, the electric response and current density of the TEM lamella device closely align with macro-scale devices. These samples exhibit ...
Source: Ultramicroscopy - February 24, 2024 Category: Laboratory Medicine Authors: Oscar Recalde-Benitez Yevheniy Pivak Tianshu Jiang Robert Winkler Alexander Zintler Esmaeil Adabifiroozjaei Philipp Komissinskiy Lambert Alff William A Hubbard H Hugo Perez-Garza Leopoldo Molina-Luna Source Type: research
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination
Ultramicroscopy. 2024 Feb 19;259:113941. doi: 10.1016/j.ultramic.2024.113941. Online ahead of print.ABSTRACTIn this paper, a methodology is presented to count the number of atoms in heterogeneous nanoparticles based on the combination of multiple annular dark field scanning transmission electron microscopy (ADF STEM) images. The different non-overlapping annular detector collection regions are selected based on the principles of optimal statistical experiment design for the atom-counting problem. To count the number of atoms, the total intensities of scattered electrons for each atomic column, the so-called scattering cros...
Source: Ultramicroscopy - February 22, 2024 Category: Laboratory Medicine Authors: D G Şentürk A De Backer S Van Aert Source Type: research
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination
Ultramicroscopy. 2024 Feb 19;259:113941. doi: 10.1016/j.ultramic.2024.113941. Online ahead of print.ABSTRACTIn this paper, a methodology is presented to count the number of atoms in heterogeneous nanoparticles based on the combination of multiple annular dark field scanning transmission electron microscopy (ADF STEM) images. The different non-overlapping annular detector collection regions are selected based on the principles of optimal statistical experiment design for the atom-counting problem. To count the number of atoms, the total intensities of scattered electrons for each atomic column, the so-called scattering cros...
Source: Ultramicroscopy - February 22, 2024 Category: Laboratory Medicine Authors: D G Şentürk A De Backer S Van Aert Source Type: research
Quantitative atomic cross section analysis by 4D-STEM and EELS
We describe the fundamental mechanism of plasmon excitation in insulators as a two-step interaction process with a fast electron. First, a target electron in the specimen is excited, the probability for which follows from the availability of atomic transitions, with a strong dependence on the column of the periodic table. Second, the dielectric response of the material determines the energy loss. The energy of the loss peak depends primarily on the valence electrons. Elastic scattering is dominant at higher angles, and can be fitted conveniently to 1/θ3.7 with a linear dependence on atomic number for light atoms. In order...
Source: Ultramicroscopy - February 15, 2024 Category: Laboratory Medicine Authors: Shahar Seifer Lothar Houben Michael Elbaum Source Type: research
Framework of compressive sensing and data compression for 4D-STEM
Ultramicroscopy. 2024 Feb 10;259:113938. doi: 10.1016/j.ultramic.2024.113938. Online ahead of print.ABSTRACTFour-dimensional Scanning Transmission Electron Microscopy (4D-STEM) is a powerful technique for high-resolution and high-precision materials characterization at multiple length scales, including the characterization of beam-sensitive materials. However, the field of view of 4D-STEM is relatively small, which in absence of live processing is limited by the data size required for storage. Furthermore, the rectilinear scan approach currently employed in 4D-STEM places a resolution- and signal-dependent dose limit for t...
Source: Ultramicroscopy - February 15, 2024 Category: Laboratory Medicine Authors: Hsu-Chih Ni Renliang Yuan Jiong Zhang Jian-Min Zuo Source Type: research
Fast detection of micro-objects using scanning electrochemical microscopy based on visual recognition and machine learning
Ultramicroscopy. 2024 Feb 14;259:113937. doi: 10.1016/j.ultramic.2024.113937. Online ahead of print.ABSTRACTScanning electrochemical microscopy (SECM) is a scanning probe microscope with an ultramicroelectrode (UME) as a probe. The technique is advantageous in the characterization of the electrochemical properties of surfaces. However, the limitations, such as slow imaging and many functions depending on the user, only allow us to use some of the possibilities. Therefore, we applied visual recognition and machine learning to detect micro-objects from the image and determine their electrochemical activity. The reconstructio...
Source: Ultramicroscopy - February 15, 2024 Category: Laboratory Medicine Authors: Vadimas Ivinskij Antanas Zinovicius Andrius Dzedzickis Jurga Subaciute-Zemaitiene Juste Rozene Vytautas Bucinskas Eugenijus Macerauskas Sonata Tolvaisiene Inga Morkvenaite-Vilkonciene Source Type: research
Quantitative atomic cross section analysis by 4D-STEM and EELS
We describe the fundamental mechanism of plasmon excitation in insulators as a two-step interaction process with a fast electron. First, a target electron in the specimen is excited, the probability for which follows from the availability of atomic transitions, with a strong dependence on the column of the periodic table. Second, the dielectric response of the material determines the energy loss. The energy of the loss peak depends primarily on the valence electrons. Elastic scattering is dominant at higher angles, and can be fitted conveniently to 1/θ3.7 with a linear dependence on atomic number for light atoms. In order...
Source: Ultramicroscopy - February 15, 2024 Category: Laboratory Medicine Authors: Shahar Seifer Lothar Houben Michael Elbaum Source Type: research
Framework of compressive sensing and data compression for 4D-STEM
Ultramicroscopy. 2024 Feb 10;259:113938. doi: 10.1016/j.ultramic.2024.113938. Online ahead of print.ABSTRACTFour-dimensional Scanning Transmission Electron Microscopy (4D-STEM) is a powerful technique for high-resolution and high-precision materials characterization at multiple length scales, including the characterization of beam-sensitive materials. However, the field of view of 4D-STEM is relatively small, which in absence of live processing is limited by the data size required for storage. Furthermore, the rectilinear scan approach currently employed in 4D-STEM places a resolution- and signal-dependent dose limit for t...
Source: Ultramicroscopy - February 15, 2024 Category: Laboratory Medicine Authors: Hsu-Chih Ni Renliang Yuan Jiong Zhang Jian-Min Zuo Source Type: research
Fast detection of micro-objects using scanning electrochemical microscopy based on visual recognition and machine learning
Ultramicroscopy. 2024 Feb 14;259:113937. doi: 10.1016/j.ultramic.2024.113937. Online ahead of print.ABSTRACTScanning electrochemical microscopy (SECM) is a scanning probe microscope with an ultramicroelectrode (UME) as a probe. The technique is advantageous in the characterization of the electrochemical properties of surfaces. However, the limitations, such as slow imaging and many functions depending on the user, only allow us to use some of the possibilities. Therefore, we applied visual recognition and machine learning to detect micro-objects from the image and determine their electrochemical activity. The reconstructio...
Source: Ultramicroscopy - February 15, 2024 Category: Laboratory Medicine Authors: Vadimas Ivinskij Antanas Zinovicius Andrius Dzedzickis Jurga Subaciute-Zemaitiene Juste Rozene Vytautas Bucinskas Eugenijus Macerauskas Sonata Tolvaisiene Inga Morkvenaite-Vilkonciene Source Type: research
Quantitative atomic cross section analysis by 4D-STEM and EELS
We describe the fundamental mechanism of plasmon excitation in insulators as a two-step interaction process with a fast electron. First, a target electron in the specimen is excited, the probability for which follows from the availability of atomic transitions, with a strong dependence on the column of the periodic table. Second, the dielectric response of the material determines the energy loss. The energy of the loss peak depends primarily on the valence electrons. Elastic scattering is dominant at higher angles, and can be fitted conveniently to 1/θ3.7 with a linear dependence on atomic number for light atoms. In order...
Source: Ultramicroscopy - February 15, 2024 Category: Laboratory Medicine Authors: Shahar Seifer Lothar Houben Michael Elbaum Source Type: research
Framework of compressive sensing and data compression for 4D-STEM
Ultramicroscopy. 2024 Feb 10;259:113938. doi: 10.1016/j.ultramic.2024.113938. Online ahead of print.ABSTRACTFour-dimensional Scanning Transmission Electron Microscopy (4D-STEM) is a powerful technique for high-resolution and high-precision materials characterization at multiple length scales, including the characterization of beam-sensitive materials. However, the field of view of 4D-STEM is relatively small, which in absence of live processing is limited by the data size required for storage. Furthermore, the rectilinear scan approach currently employed in 4D-STEM places a resolution- and signal-dependent dose limit for t...
Source: Ultramicroscopy - February 15, 2024 Category: Laboratory Medicine Authors: Hsu-Chih Ni Renliang Yuan Jiong Zhang Jian-Min Zuo Source Type: research
Fast detection of micro-objects using scanning electrochemical microscopy based on visual recognition and machine learning
Ultramicroscopy. 2024 Feb 14;259:113937. doi: 10.1016/j.ultramic.2024.113937. Online ahead of print.ABSTRACTScanning electrochemical microscopy (SECM) is a scanning probe microscope with an ultramicroelectrode (UME) as a probe. The technique is advantageous in the characterization of the electrochemical properties of surfaces. However, the limitations, such as slow imaging and many functions depending on the user, only allow us to use some of the possibilities. Therefore, we applied visual recognition and machine learning to detect micro-objects from the image and determine their electrochemical activity. The reconstructio...
Source: Ultramicroscopy - February 15, 2024 Category: Laboratory Medicine Authors: Vadimas Ivinskij Antanas Zinovicius Andrius Dzedzickis Jurga Subaciute-Zemaitiene Juste Rozene Vytautas Bucinskas Eugenijus Macerauskas Sonata Tolvaisiene Inga Morkvenaite-Vilkonciene Source Type: research
