Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy
Ultramicroscopy. 2024 Apr 22;262:113978. doi: 10.1016/j.ultramic.2024.113978. Online ahead of print.ABSTRACTIn this work we instigated the fragmentation of Au microparticles supported on a thin amorphous carbon film by irradiating them with a gradually convergent electron beam inside the Transmission Electron Microscope. This phenomenon has been generically labeled as "electron beam-induced fragmentation" or EBIF and its physical origin remains contested. On the one hand, EBIF has been primarily characterized as a consequence of beam-induced heating. On the other, EBIF has been attributed to beam-induced charging eventuall...
Source: Ultramicroscopy - May 1, 2024 Category: Laboratory Medicine Authors: Wen Feng Thomas Gemming Lars Giebeler Jiang Qu Kristina Weinel Leonardo Agudo J ácome Bernd B üchner Ignacio Gonzalez-Martinez Source Type: research
Standardization and quantification of backscattered electron imaging in scanning electron microscopy
Ultramicroscopy. 2024 Apr 26;262:113982. doi: 10.1016/j.ultramic.2024.113982. Online ahead of print.ABSTRACTBackscattered electron (BSE) imaging based on scanning electron microscopy (SEM) has been widely used in scientific and industrial disciplines. However, achieving consistent standards and precise quantification in BSE images has proven to be a long-standing challenge. Previous methods incorporating dedicated calibration processes and Monte Carlo simulations have still posed practical limitations for widespread adoption. Here we introduce a bolometer platform that directly measures the absorbed thermal energy of the s...
Source: Ultramicroscopy - May 1, 2024 Category: Laboratory Medicine Authors: Shih-Ming Wang Yu-Cheng Chiu Yu-Hsin Wu Bo-Yi Chen I-Ling Chang Chih-Wei Chang Source Type: research
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy
Ultramicroscopy. 2024 Apr 22;262:113978. doi: 10.1016/j.ultramic.2024.113978. Online ahead of print.ABSTRACTIn this work we instigated the fragmentation of Au microparticles supported on a thin amorphous carbon film by irradiating them with a gradually convergent electron beam inside the Transmission Electron Microscope. This phenomenon has been generically labeled as "electron beam-induced fragmentation" or EBIF and its physical origin remains contested. On the one hand, EBIF has been primarily characterized as a consequence of beam-induced heating. On the other, EBIF has been attributed to beam-induced charging eventuall...
Source: Ultramicroscopy - May 1, 2024 Category: Laboratory Medicine Authors: Wen Feng Thomas Gemming Lars Giebeler Jiang Qu Kristina Weinel Leonardo Agudo J ácome Bernd B üchner Ignacio Gonzalez-Martinez Source Type: research
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)
Ultramicroscopy. 2024 Apr 23;262:113977. doi: 10.1016/j.ultramic.2024.113977. Online ahead of print.ABSTRACTElectron beam damage in electron microscopes is becoming more and more problematic in material research with the increasing demand of characterization of new beam sensitive material such as Li based compounds used in lithium-ion batteries. To avoid radiolysis damage, it has become common practice to use Cryo-EM, however, knock-on damage can still occur in conventional TEM/STEM with a high-accelerating voltage (200-300 keV). In this work, electron energy loss spectroscopy with an accelerating voltage of 30,20 and 10 k...
Source: Ultramicroscopy - April 28, 2024 Category: Laboratory Medicine Authors: Nicolas Dumaresq Nicolas Brodusch St éphanie Bessette Raynald Gauvin Source Type: research
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)
Ultramicroscopy. 2024 Apr 23;262:113977. doi: 10.1016/j.ultramic.2024.113977. Online ahead of print.ABSTRACTElectron beam damage in electron microscopes is becoming more and more problematic in material research with the increasing demand of characterization of new beam sensitive material such as Li based compounds used in lithium-ion batteries. To avoid radiolysis damage, it has become common practice to use Cryo-EM, however, knock-on damage can still occur in conventional TEM/STEM with a high-accelerating voltage (200-300 keV). In this work, electron energy loss spectroscopy with an accelerating voltage of 30,20 and 10 k...
Source: Ultramicroscopy - April 28, 2024 Category: Laboratory Medicine Authors: Nicolas Dumaresq Nicolas Brodusch St éphanie Bessette Raynald Gauvin Source Type: research
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)
Ultramicroscopy. 2024 Apr 23;262:113977. doi: 10.1016/j.ultramic.2024.113977. Online ahead of print.ABSTRACTElectron beam damage in electron microscopes is becoming more and more problematic in material research with the increasing demand of characterization of new beam sensitive material such as Li based compounds used in lithium-ion batteries. To avoid radiolysis damage, it has become common practice to use Cryo-EM, however, knock-on damage can still occur in conventional TEM/STEM with a high-accelerating voltage (200-300 keV). In this work, electron energy loss spectroscopy with an accelerating voltage of 30,20 and 10 k...
Source: Ultramicroscopy - April 28, 2024 Category: Laboratory Medicine Authors: Nicolas Dumaresq Nicolas Brodusch St éphanie Bessette Raynald Gauvin Source Type: research
Ghostbuster: A phase retrieval diffraction tomography algorithm for cryo-EM
Ultramicroscopy. 2024 Apr 12;262:113962. doi: 10.1016/j.ultramic.2024.113962. Online ahead of print.ABSTRACTEwald sphere curvature correction, which extends beyond the projection approximation, stretches the shallow depth of field in cryo-EM reconstructions of thick particles. Here we show that even for previously assumed thin particles, reconstruction artifacts which we refer to as ghosts can appear. By retrieving the lost phases of the electron exitwaves and accounting for the first Born approximation scattering within the particle, we show that these ghosts can be effectively eliminated. Our simulations demonstrate how ...
Source: Ultramicroscopy - April 20, 2024 Category: Laboratory Medicine Authors: Joel Yeo Benedikt J Daurer Dari Kimanius Deepan Balakrishnan Tristan Bepler Yong Zi Tan N Duane Loh Source Type: research
Ghostbuster: A phase retrieval diffraction tomography algorithm for cryo-EM
Ultramicroscopy. 2024 Apr 12;262:113962. doi: 10.1016/j.ultramic.2024.113962. Online ahead of print.ABSTRACTEwald sphere curvature correction, which extends beyond the projection approximation, stretches the shallow depth of field in cryo-EM reconstructions of thick particles. Here we show that even for previously assumed thin particles, reconstruction artifacts which we refer to as ghosts can appear. By retrieving the lost phases of the electron exitwaves and accounting for the first Born approximation scattering within the particle, we show that these ghosts can be effectively eliminated. Our simulations demonstrate how ...
Source: Ultramicroscopy - April 20, 2024 Category: Laboratory Medicine Authors: Joel Yeo Benedikt J Daurer Dari Kimanius Deepan Balakrishnan Tristan Bepler Yong Zi Tan N Duane Loh Source Type: research
Ghostbuster: A phase retrieval diffraction tomography algorithm for cryo-EM
Ultramicroscopy. 2024 Apr 12;262:113962. doi: 10.1016/j.ultramic.2024.113962. Online ahead of print.ABSTRACTEwald sphere curvature correction, which extends beyond the projection approximation, stretches the shallow depth of field in cryo-EM reconstructions of thick particles. Here we show that even for previously assumed thin particles, reconstruction artifacts which we refer to as ghosts can appear. By retrieving the lost phases of the electron exitwaves and accounting for the first Born approximation scattering within the particle, we show that these ghosts can be effectively eliminated. Our simulations demonstrate how ...
Source: Ultramicroscopy - April 20, 2024 Category: Laboratory Medicine Authors: Joel Yeo Benedikt J Daurer Dari Kimanius Deepan Balakrishnan Tristan Bepler Yong Zi Tan N Duane Loh Source Type: research
Ghostbuster: A phase retrieval diffraction tomography algorithm for cryo-EM
Ultramicroscopy. 2024 Apr 12;262:113962. doi: 10.1016/j.ultramic.2024.113962. Online ahead of print.ABSTRACTEwald sphere curvature correction, which extends beyond the projection approximation, stretches the shallow depth of field in cryo-EM reconstructions of thick particles. Here we show that even for previously assumed thin particles, reconstruction artifacts which we refer to as ghosts can appear. By retrieving the lost phases of the electron exitwaves and accounting for the first Born approximation scattering within the particle, we show that these ghosts can be effectively eliminated. Our simulations demonstrate how ...
Source: Ultramicroscopy - April 20, 2024 Category: Laboratory Medicine Authors: Joel Yeo Benedikt J Daurer Dari Kimanius Deepan Balakrishnan Tristan Bepler Yong Zi Tan N Duane Loh Source Type: research
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning
In this report, we show how clearer structural and surface information at nanoscale can be obtained by SLEEM, coupled with deep learning. The method is demonstrated using Au nanoparticles-loaded mesoporous silica as a model system. Moreover, unlike conventional scanning electron microscopy (SEM), SLEEM does not require the samples to be coated with conductive films for analysis; thus, not only it is convenient to use but it also does not give artifacts. The results further reveal that SLEEM and deep learning can serve as great tools to analyze materials at nanoscale well. The biggest advantage of the presented method is it...
Source: Ultramicroscopy - April 19, 2024 Category: Laboratory Medicine Authors: Eli ška Materna Mikmeková Ji ří Materna Ivo Konvalina Šárka Mikmeková Ilona M üllerová Tewodros Asefa Source Type: research
Strain visualization using large-angle convergent-beam electron diffraction
In this study, we report a strain visualization method using large-angle convergent-beam electron diffraction (LACBED).1 We compare the proposed method with the strain maps acquired via STEM-NBD, a combination of scanning transmission electron microscopy (STEM) and nanobeam electron diffraction (NBD). Although STEM-NBD can precisely measure the lattice parameters, it requires a large amount of data and personal computer (PC) resources to obtain a two-dimensional strain map. Deficiency lines in the transmitted disk of LACBED reflect the crystalline structure information and move, curve, or disappear in the deformed area. Pr...
Source: Ultramicroscopy - April 14, 2024 Category: Laboratory Medicine Authors: Fumihiko Uesugi Chiaki Tanii Naoyuki Sugiyama Masaki Takeguchi Source Type: research
Secondary-electron imaging of bulk crystalline specimens in an aberration corrected STEM
In this study, we explore the practicality of scanning transmission electron microscope (STEM) imaging with secondary electrons (SE), using a silicon-wedge specimen having a maximum thickness of 18 μm. We find that the atomic structure is present in the entire thickness range of the SE images although the background intensity increases moderately with thickness. The consistent intensity of secondary electron (SE) images at atomic positions and the modest increase in background intensity observed in silicon suggest a limited contribution from SEs generated by backscattered electrons, a conclusion supported by our multislic...
Source: Ultramicroscopy - April 14, 2024 Category: Laboratory Medicine Authors: Sooyeon Hwang Lijun Wu Kim Kisslinger Judith Yang Ray Egerton Yimei Zhu Source Type: research
Strain visualization using large-angle convergent-beam electron diffraction
In this study, we report a strain visualization method using large-angle convergent-beam electron diffraction (LACBED).1 We compare the proposed method with the strain maps acquired via STEM-NBD, a combination of scanning transmission electron microscopy (STEM) and nanobeam electron diffraction (NBD). Although STEM-NBD can precisely measure the lattice parameters, it requires a large amount of data and personal computer (PC) resources to obtain a two-dimensional strain map. Deficiency lines in the transmitted disk of LACBED reflect the crystalline structure information and move, curve, or disappear in the deformed area. Pr...
Source: Ultramicroscopy - April 14, 2024 Category: Laboratory Medicine Authors: Fumihiko Uesugi Chiaki Tanii Naoyuki Sugiyama Masaki Takeguchi Source Type: research
Secondary-electron imaging of bulk crystalline specimens in an aberration corrected STEM
In this study, we explore the practicality of scanning transmission electron microscope (STEM) imaging with secondary electrons (SE), using a silicon-wedge specimen having a maximum thickness of 18 μm. We find that the atomic structure is present in the entire thickness range of the SE images although the background intensity increases moderately with thickness. The consistent intensity of secondary electron (SE) images at atomic positions and the modest increase in background intensity observed in silicon suggest a limited contribution from SEs generated by backscattered electrons, a conclusion supported by our multislic...
Source: Ultramicroscopy - April 14, 2024 Category: Laboratory Medicine Authors: Sooyeon Hwang Lijun Wu Kim Kisslinger Judith Yang Ray Egerton Yimei Zhu Source Type: research
