The target region focused imaging method for scanning ion conductance microscopy
Ultramicroscopy. 2023 Dec 9;257:113910. doi: 10.1016/j.ultramic.2023.113910. Online ahead of print.ABSTRACTScanning ion conductance microscopy (SICM) has developed rapidly and has wide applications in biomedicine, single-cell science and other fields. SICM scanning speed is limited by the conventional raster-type scanning method, which spends most of time on imaging the substrate and does not focus enough on the target area. In order to solve this problem, a target region focused (TRF) method is proposed, which can effectively avoid the scanning of unnecessary substrate areas and enables SICM to image the target area only ...
Source: Ultramicroscopy - December 13, 2023 Category: Laboratory Medicine Authors: Shengbo Gu Jian Zhuang Tianying Wang Shiting Hu Weilun Song Xiaobo Liao Source Type: research
Focused ion beam milling and MicroED structure determination of metal-organic framework crystals
We report new advancements in the determination and high-resolution structural analysis of beam-sensitive metal organic frameworks (MOFs) using microcrystal electron diffraction (MicroED) coupled with focused ion beam milling at cryogenic temperatures (cryo-FIB). A microcrystal of the beam-sensitive MOF, ZIF-8, was ion-beam milled in a thin lamella approximately 150 nm thick. MicroED data were collected from this thin lamella using an energy filter and a direct electron detector operating in counting mode. Using this approach, we achieved a greatly improved resolution of 0.59 Å with a minimal total exposure of only 0.64 e...
Source: Ultramicroscopy - December 12, 2023 Category: Laboratory Medicine Authors: Andrey A Bardin Alison Haymaker Fateme Banihashemi Jerry Y S Lin Michael W Martynowycz Brent L Nannenga Source Type: research
Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors
Ultramicroscopy. 2023 Dec 7;257:113902. doi: 10.1016/j.ultramic.2023.113902. Online ahead of print.ABSTRACTDiffraction pattern analysis can be used to reveal the crystalline structure of materials, and this information is used to nano- and micro-structure of advanced engineering materials that enable modern life. For nano-structured materials typically diffraction pattern analysis is performed in the transmission electron microscope (TEM) and TEM diffraction patterns typically have a limited angular range (less than a few degrees) due to the long camera length, and this requires analysis of multiple patterns to probe a uni...
Source: Ultramicroscopy - December 12, 2023 Category: Laboratory Medicine Authors: Tianbi Zhang T Ben Britton Source Type: research
Programmable comprehensive controller for multi-color 3D confocal spinning-disk image scanning microscope
Ultramicroscopy. 2023 Dec 10;257:113888. doi: 10.1016/j.ultramic.2023.113888. Online ahead of print.ABSTRACTThis paper introduces a compact, portable, and highly accurate triggering control system for a 3D confocal spinning-disk image scanning microscope (CSD-ISM). Building upon on our previously published research, we expanded the hardware of the controller and synchronized it with a sub-micron translator which scans the object in the z-direction. As well as expanding the hardware, the software also was extended from previously published work similarly as it is stated for hardware while allowing full control over the 3D m...
Source: Ultramicroscopy - December 12, 2023 Category: Laboratory Medicine Authors: Eli Flaxer Lanna Bram Alona Flaxer Yael Roichman Yuval Ebenstein Source Type: research
Segmentability evaluation of back-scattered SEM images of multiphase materials
Ultramicroscopy. 2023 Nov 24;257:113892. doi: 10.1016/j.ultramic.2023.113892. Online ahead of print.ABSTRACTSegmentation methods are very useful tools in the Electron Microscopy inspection of materials, enabling the extraction of quantitative results from microscopy images. Back-Scattered Electron (BSE) images carry information of the mean atomic number in the interaction volume and hence can be used to quantify the phase composition in multiphase materials. Since phase composition and proportion affects the material properties and hence its applications, the segmentation accuracy of such images rendered of critical import...
Source: Ultramicroscopy - December 8, 2023 Category: Laboratory Medicine Authors: Manolis Chatzigeorgiou Vassilios Constantoudis Marios Katsiotis Margarita Beazi-Katsioti Nikos Boukos Source Type: research
Preface to the twelfth international workshop on low energy microscopy and photoemission electron microscopy (LEEM/PEEM 12)
Ultramicroscopy. 2023 Nov 18:113887. doi: 10.1016/j.ultramic.2023.113887. Online ahead of print.NO ABSTRACTPMID:38065802 | DOI:10.1016/j.ultramic.2023.113887 (Source: Ultramicroscopy)
Source: Ultramicroscopy - December 8, 2023 Category: Laboratory Medicine Authors: Michael Foerster Juan de la Figuera Irene Palacio Lucia Aballe Source Type: research
Segmentability evaluation of back-scattered SEM images of multiphase materials
Ultramicroscopy. 2023 Nov 24;257:113892. doi: 10.1016/j.ultramic.2023.113892. Online ahead of print.ABSTRACTSegmentation methods are very useful tools in the Electron Microscopy inspection of materials, enabling the extraction of quantitative results from microscopy images. Back-Scattered Electron (BSE) images carry information of the mean atomic number in the interaction volume and hence can be used to quantify the phase composition in multiphase materials. Since phase composition and proportion affects the material properties and hence its applications, the segmentation accuracy of such images rendered of critical import...
Source: Ultramicroscopy - December 8, 2023 Category: Laboratory Medicine Authors: Manolis Chatzigeorgiou Vassilios Constantoudis Marios Katsiotis Margarita Beazi-Katsioti Nikos Boukos Source Type: research
Preface to the twelfth international workshop on low energy microscopy and photoemission electron microscopy (LEEM/PEEM 12)
Ultramicroscopy. 2023 Nov 18:113887. doi: 10.1016/j.ultramic.2023.113887. Online ahead of print.NO ABSTRACTPMID:38065802 | DOI:10.1016/j.ultramic.2023.113887 (Source: Ultramicroscopy)
Source: Ultramicroscopy - December 8, 2023 Category: Laboratory Medicine Authors: Michael Foerster Juan de la Figuera Irene Palacio Lucia Aballe Source Type: research
Segmentability evaluation of back-scattered SEM images of multiphase materials
Ultramicroscopy. 2023 Nov 24;257:113892. doi: 10.1016/j.ultramic.2023.113892. Online ahead of print.ABSTRACTSegmentation methods are very useful tools in the Electron Microscopy inspection of materials, enabling the extraction of quantitative results from microscopy images. Back-Scattered Electron (BSE) images carry information of the mean atomic number in the interaction volume and hence can be used to quantify the phase composition in multiphase materials. Since phase composition and proportion affects the material properties and hence its applications, the segmentation accuracy of such images rendered of critical import...
Source: Ultramicroscopy - December 8, 2023 Category: Laboratory Medicine Authors: Manolis Chatzigeorgiou Vassilios Constantoudis Marios Katsiotis Margarita Beazi-Katsioti Nikos Boukos Source Type: research
Preface to the twelfth international workshop on low energy microscopy and photoemission electron microscopy (LEEM/PEEM 12)
Ultramicroscopy. 2023 Nov 18:113887. doi: 10.1016/j.ultramic.2023.113887. Online ahead of print.NO ABSTRACTPMID:38065802 | DOI:10.1016/j.ultramic.2023.113887 (Source: Ultramicroscopy)
Source: Ultramicroscopy - December 8, 2023 Category: Laboratory Medicine Authors: Michael Foerster Juan de la Figuera Irene Palacio Lucia Aballe Source Type: research
Segmentability evaluation of back-scattered SEM images of multiphase materials
Ultramicroscopy. 2023 Nov 24;257:113892. doi: 10.1016/j.ultramic.2023.113892. Online ahead of print.ABSTRACTSegmentation methods are very useful tools in the Electron Microscopy inspection of materials, enabling the extraction of quantitative results from microscopy images. Back-Scattered Electron (BSE) images carry information of the mean atomic number in the interaction volume and hence can be used to quantify the phase composition in multiphase materials. Since phase composition and proportion affects the material properties and hence its applications, the segmentation accuracy of such images rendered of critical import...
Source: Ultramicroscopy - December 8, 2023 Category: Laboratory Medicine Authors: Manolis Chatzigeorgiou Vassilios Constantoudis Marios Katsiotis Margarita Beazi-Katsioti Nikos Boukos Source Type: research
Preface to the twelfth international workshop on low energy microscopy and photoemission electron microscopy (LEEM/PEEM 12)
Ultramicroscopy. 2023 Nov 18:113887. doi: 10.1016/j.ultramic.2023.113887. Online ahead of print.NO ABSTRACTPMID:38065802 | DOI:10.1016/j.ultramic.2023.113887 (Source: Ultramicroscopy)
Source: Ultramicroscopy - December 8, 2023 Category: Laboratory Medicine Authors: Michael Foerster Juan de la Figuera Irene Palacio Lucia Aballe Source Type: research
"Depo-all-around": A novel FIB-based TEM specimen preparation technique for solid state battery composites and other loosely bound samples
Ultramicroscopy. 2023 Dec 5;257:113904. doi: 10.1016/j.ultramic.2023.113904. Online ahead of print.ABSTRACTInterfacial phenomena between active cathode materials and solid electrolytes play an important role in the function of solid-state batteries. (S)TEM imaging can give valuable insight into the atomic structure and composition at the various interfaces, yet the preparation of TEM specimen by FIB (focused ion beam) is challenging for loosely bound samples like composites, as they easily break apart during conventional preparation routines. We propose a novel preparation method that uses a frame made of deposition layers...
Source: Ultramicroscopy - December 7, 2023 Category: Laboratory Medicine Authors: Thomas Demuth Till Fuchs Andreas Beyer J ürgen Janek Kerstin Volz Source Type: research
"Depo-all-around": A novel FIB-based TEM specimen preparation technique for solid state battery composites and other loosely bound samples
Ultramicroscopy. 2023 Dec 5;257:113904. doi: 10.1016/j.ultramic.2023.113904. Online ahead of print.ABSTRACTInterfacial phenomena between active cathode materials and solid electrolytes play an important role in the function of solid-state batteries. (S)TEM imaging can give valuable insight into the atomic structure and composition at the various interfaces, yet the preparation of TEM specimen by FIB (focused ion beam) is challenging for loosely bound samples like composites, as they easily break apart during conventional preparation routines. We propose a novel preparation method that uses a frame made of deposition layers...
Source: Ultramicroscopy - December 7, 2023 Category: Laboratory Medicine Authors: Thomas Demuth Till Fuchs Andreas Beyer J ürgen Janek Kerstin Volz Source Type: research
Correlating electrochemical stimulus to structural change in liquid electron microscopy videos using the structural dissimilarity metric
In this study, DSSIM analysis is applied to two in-situ LCTEM videos to demonstrate how to implement this algorithm and interpret the results. We show DSSIM analysis can be used as a visualization tool for qualitative data analysis by highlighting structural changes which are easily missed when viewing the raw data. Furthermore, we demonstrate how DSSIM analysis can serve as a quantitative metric and efficiently convert 3-dimensional microscopy videos to 1-dimenional plots which makes it easy to interpret and compare events occurring at different timepoints in a video. In the analyses presented here, DSSIM is used to direc...
Source: Ultramicroscopy - December 6, 2023 Category: Laboratory Medicine Authors: Justin T Mulvey Katen P Iyer Tom às Ortega Jovany G Merham Yevheniy Pivak Hongyu Sun Allon I Hochbaum Joseph P Patterson Source Type: research
