On central focusing for contrast optimization in direct electron ptychography of thick samples
Ultramicroscopy. 2023 Nov 3;256:113879. doi: 10.1016/j.ultramic.2023.113879. Online ahead of print.ABSTRACTPtychography provides high dose efficiency images that can reveal light elements next to heavy atoms. However, despite ptychography having an otherwise single signed contrast transfer function, contrast reversals can occur when the projected potential becomes strong for both direct and iterative inversion ptychography methods. It has recently been shown that these reversals can often be counteracted in direct ptychography methods by adapting the focus. Here we provide an explanation of why the best contrast is often f...
Source: Ultramicroscopy - November 9, 2023 Category: Laboratory Medicine Authors: C Gao C Hofer T J Pennycook Source Type: research
On central focusing for contrast optimization in direct electron ptychography of thick samples
Ultramicroscopy. 2023 Nov 3;256:113879. doi: 10.1016/j.ultramic.2023.113879. Online ahead of print.ABSTRACTPtychography provides high dose efficiency images that can reveal light elements next to heavy atoms. However, despite ptychography having an otherwise single signed contrast transfer function, contrast reversals can occur when the projected potential becomes strong for both direct and iterative inversion ptychography methods. It has recently been shown that these reversals can often be counteracted in direct ptychography methods by adapting the focus. Here we provide an explanation of why the best contrast is often f...
Source: Ultramicroscopy - November 9, 2023 Category: Laboratory Medicine Authors: C Gao C Hofer T J Pennycook Source Type: research
On central focusing for contrast optimization in direct electron ptychography of thick samples
Ultramicroscopy. 2023 Nov 3;256:113879. doi: 10.1016/j.ultramic.2023.113879. Online ahead of print.ABSTRACTPtychography provides high dose efficiency images that can reveal light elements next to heavy atoms. However, despite ptychography having an otherwise single signed contrast transfer function, contrast reversals can occur when the projected potential becomes strong for both direct and iterative inversion ptychography methods. It has recently been shown that these reversals can often be counteracted in direct ptychography methods by adapting the focus. Here we provide an explanation of why the best contrast is often f...
Source: Ultramicroscopy - November 9, 2023 Category: Laboratory Medicine Authors: C Gao C Hofer T J Pennycook Source Type: research
On central focusing for contrast optimization in direct electron ptychography of thick samples
Ultramicroscopy. 2023 Nov 3;256:113879. doi: 10.1016/j.ultramic.2023.113879. Online ahead of print.ABSTRACTPtychography provides high dose efficiency images that can reveal light elements next to heavy atoms. However, despite ptychography having an otherwise single signed contrast transfer function, contrast reversals can occur when the projected potential becomes strong for both direct and iterative inversion ptychography methods. It has recently been shown that these reversals can often be counteracted in direct ptychography methods by adapting the focus. Here we provide an explanation of why the best contrast is often f...
Source: Ultramicroscopy - November 9, 2023 Category: Laboratory Medicine Authors: C Gao C Hofer T J Pennycook Source Type: research
Optical STEM detection for scanning electron microscopy
Ultramicroscopy. 2023 Oct 30;256:113877. doi: 10.1016/j.ultramic.2023.113877. Online ahead of print.ABSTRACTRecent advances in electron microscopy techniques have led to a significant scale up in volumetric imaging of biological tissue. The throughput of electron microscopes, however, remains a limiting factor for the volume that can be imaged in high resolution within reasonable time. Faster detection methods will improve throughput. Here, we have characterized and benchmarked a novel detection technique for scanning electron microscopy: optical scanning transmission electron microscopy (OSTEM). A qualitative and quantita...
Source: Ultramicroscopy - November 6, 2023 Category: Laboratory Medicine Authors: Arent J Kievits B H Peter Duinkerken Job Fermie Ryan Lane Ben N G Giepmans Jacob P Hoogenboom Source Type: research
Optical STEM detection for scanning electron microscopy
Ultramicroscopy. 2023 Oct 30;256:113877. doi: 10.1016/j.ultramic.2023.113877. Online ahead of print.ABSTRACTRecent advances in electron microscopy techniques have led to a significant scale up in volumetric imaging of biological tissue. The throughput of electron microscopes, however, remains a limiting factor for the volume that can be imaged in high resolution within reasonable time. Faster detection methods will improve throughput. Here, we have characterized and benchmarked a novel detection technique for scanning electron microscopy: optical scanning transmission electron microscopy (OSTEM). A qualitative and quantita...
Source: Ultramicroscopy - November 6, 2023 Category: Laboratory Medicine Authors: Arent J Kievits B H Peter Duinkerken Job Fermie Ryan Lane Ben N G Giepmans Jacob P Hoogenboom Source Type: research
Optical STEM detection for scanning electron microscopy
Ultramicroscopy. 2023 Oct 30;256:113877. doi: 10.1016/j.ultramic.2023.113877. Online ahead of print.ABSTRACTRecent advances in electron microscopy techniques have led to a significant scale up in volumetric imaging of biological tissue. The throughput of electron microscopes, however, remains a limiting factor for the volume that can be imaged in high resolution within reasonable time. Faster detection methods will improve throughput. Here, we have characterized and benchmarked a novel detection technique for scanning electron microscopy: optical scanning transmission electron microscopy (OSTEM). A qualitative and quantita...
Source: Ultramicroscopy - November 6, 2023 Category: Laboratory Medicine Authors: Arent J Kievits B H Peter Duinkerken Job Fermie Ryan Lane Ben N G Giepmans Jacob P Hoogenboom Source Type: research
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV
Ultramicroscopy. 2023 Oct 22;256:113876. doi: 10.1016/j.ultramic.2023.113876. Online ahead of print.ABSTRACTWe evaluated the usable specimen thickness of Si for lattice imaging on a transmission electron microscopy (TEM) instrument operating at 300 kV and equipped with a complementary metal-oxide-semiconductor camera by using an original reference material (RM) and comparing the lattice images obtained from Si patterns of the RM with various thicknesses. Lattice images of the {111} planes of crystalline Si are successfully observed for patterns with thicknesses of up to 508 nm. However, the contrast of these lattice fringe...
Source: Ultramicroscopy - October 27, 2023 Category: Laboratory Medicine Authors: Keita Kobayashi Ryosuke Kizu Source Type: research
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV
Ultramicroscopy. 2023 Oct 22;256:113876. doi: 10.1016/j.ultramic.2023.113876. Online ahead of print.ABSTRACTWe evaluated the usable specimen thickness of Si for lattice imaging on a transmission electron microscopy (TEM) instrument operating at 300 kV and equipped with a complementary metal-oxide-semiconductor camera by using an original reference material (RM) and comparing the lattice images obtained from Si patterns of the RM with various thicknesses. Lattice images of the {111} planes of crystalline Si are successfully observed for patterns with thicknesses of up to 508 nm. However, the contrast of these lattice fringe...
Source: Ultramicroscopy - October 27, 2023 Category: Laboratory Medicine Authors: Keita Kobayashi Ryosuke Kizu Source Type: research
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV
Ultramicroscopy. 2023 Oct 22;256:113876. doi: 10.1016/j.ultramic.2023.113876. Online ahead of print.ABSTRACTWe evaluated the usable specimen thickness of Si for lattice imaging on a transmission electron microscopy (TEM) instrument operating at 300 kV and equipped with a complementary metal-oxide-semiconductor camera by using an original reference material (RM) and comparing the lattice images obtained from Si patterns of the RM with various thicknesses. Lattice images of the {111} planes of crystalline Si are successfully observed for patterns with thicknesses of up to 508 nm. However, the contrast of these lattice fringe...
Source: Ultramicroscopy - October 27, 2023 Category: Laboratory Medicine Authors: Keita Kobayashi Ryosuke Kizu Source Type: research
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV
Ultramicroscopy. 2023 Oct 22;256:113876. doi: 10.1016/j.ultramic.2023.113876. Online ahead of print.ABSTRACTWe evaluated the usable specimen thickness of Si for lattice imaging on a transmission electron microscopy (TEM) instrument operating at 300 kV and equipped with a complementary metal-oxide-semiconductor camera by using an original reference material (RM) and comparing the lattice images obtained from Si patterns of the RM with various thicknesses. Lattice images of the {111} planes of crystalline Si are successfully observed for patterns with thicknesses of up to 508 nm. However, the contrast of these lattice fringe...
Source: Ultramicroscopy - October 27, 2023 Category: Laboratory Medicine Authors: Keita Kobayashi Ryosuke Kizu Source Type: research
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV
Ultramicroscopy. 2023 Oct 22;256:113876. doi: 10.1016/j.ultramic.2023.113876. Online ahead of print.ABSTRACTWe evaluated the usable specimen thickness of Si for lattice imaging on a transmission electron microscopy (TEM) instrument operating at 300 kV and equipped with a complementary metal-oxide-semiconductor camera by using an original reference material (RM) and comparing the lattice images obtained from Si patterns of the RM with various thicknesses. Lattice images of the {111} planes of crystalline Si are successfully observed for patterns with thicknesses of up to 508 nm. However, the contrast of these lattice fringe...
Source: Ultramicroscopy - October 27, 2023 Category: Laboratory Medicine Authors: Keita Kobayashi Ryosuke Kizu Source Type: research
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV
Ultramicroscopy. 2023 Oct 22;256:113876. doi: 10.1016/j.ultramic.2023.113876. Online ahead of print.ABSTRACTWe evaluated the usable specimen thickness of Si for lattice imaging on a transmission electron microscopy (TEM) instrument operating at 300 kV and equipped with a complementary metal-oxide-semiconductor camera by using an original reference material (RM) and comparing the lattice images obtained from Si patterns of the RM with various thicknesses. Lattice images of the {111} planes of crystalline Si are successfully observed for patterns with thicknesses of up to 508 nm. However, the contrast of these lattice fringe...
Source: Ultramicroscopy - October 27, 2023 Category: Laboratory Medicine Authors: Keita Kobayashi Ryosuke Kizu Source Type: research
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV
Ultramicroscopy. 2023 Oct 22;256:113876. doi: 10.1016/j.ultramic.2023.113876. Online ahead of print.ABSTRACTWe evaluated the usable specimen thickness of Si for lattice imaging on a transmission electron microscopy (TEM) instrument operating at 300 kV and equipped with a complementary metal-oxide-semiconductor camera by using an original reference material (RM) and comparing the lattice images obtained from Si patterns of the RM with various thicknesses. Lattice images of the {111} planes of crystalline Si are successfully observed for patterns with thicknesses of up to 508 nm. However, the contrast of these lattice fringe...
Source: Ultramicroscopy - October 27, 2023 Category: Laboratory Medicine Authors: Keita Kobayashi Ryosuke Kizu Source Type: research
Atom counting based on Voronoi averaged STEM intensities using a crosstalk correction scheme
Ultramicroscopy. 2023 Oct 17;256:113867. doi: 10.1016/j.ultramic.2023.113867. Online ahead of print.ABSTRACTIf quantitative scanning transmission electron microscopy is used for very precise thickness measurements with atomic resolution, it is commonly referred to as »atom counting«. Due to scattering and the finite probe extent the signal recorded in one atomic column is dependent not only on its own height but also on the height of its neighbours. Especially for thicker specimens this crosstalk effect can have significant impact on the measured intensity. If it is not appropriately accounted for in the evaluation, it c...
Source: Ultramicroscopy - October 23, 2023 Category: Laboratory Medicine Authors: Florian F Krause Andreas Rosenauer Source Type: research
