Accurate and fast localization of EBSD pattern centers for screen moving technology
Ultramicroscopy. 2024 Jan 20;259:113924. doi: 10.1016/j.ultramic.2024.113924. Online ahead of print.ABSTRACTThe authors of this study develop an accurate and fast method for the localization of the pattern centers (PCs) in the electron backscatter diffraction (EBSD) technique by using the model of deformation of screen moving technology. The proposed algorithm is divided into two steps: (a) Approximation: We use collinear feature points to obtain the initial value of the coordinates of the PC and the zoom factor. (b) Subdivision: We then construct a deformation function containing the three parameters to be solved, select ...
Source: Ultramicroscopy - February 3, 2024 Category: Laboratory Medicine Authors: Wei Li Xingui Zhou Jingchao Xu Ruyue Zhang Lizhao Lai Yi Zeng Hong Miao Source Type: research
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping
Ultramicroscopy. 2024 Jan 16;259:113925. doi: 10.1016/j.ultramic.2024.113925. Online ahead of print.ABSTRACTWe show the benefit of the use of atomic force microscopy (AFM) in spectroscopy force mode (FV: force volume) for evaluation of the cosmetic active effectiveness in improving the mechanical properties of human hair fibers cortex region. For this, we characterized human hair fibers without and with chemical damage caused by bleaching process. Fiber and resin (embedding material) data were obtained simultaneously in the mapping in order to have the resin data as a reference to ensure a coherent comparison between data ...
Source: Ultramicroscopy - January 28, 2024 Category: Laboratory Medicine Authors: Raissa Lima de Oblitas Fl ávio Bueno de Camargo Junior Wagner Vidal Magalh ães Fernanda de S á Teixeira Maria Cec ília Salvadori Source Type: research
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration
Ultramicroscopy. 2024 Apr;258:113912. doi: 10.1016/j.ultramic.2023.113912. Epub 2023 Dec 29.ABSTRACTCoherent diffraction imaging (CDI) and its scanning version, ptychography, are lensless imaging approaches used to iteratively retrieve a sample's complex scattering amplitude from its measured diffraction patterns. These imaging methods are most useful in extreme ultraviolet (EUV) and X-ray regions of the electromagnetic spectrum, where efficient imaging optics are difficult to manufacture. CDI relies on high signal-to-noise ratio diffraction data to recover the phase, but increasing the flux can cause saturation effects on...
Source: Ultramicroscopy - January 13, 2024 Category: Laboratory Medicine Authors: Atoosa Dejkameh Ricarda Nebling Uldis Locans Hyun-Su Kim Iacopo Mochi Yasin Ekinci Source Type: research
Phase offset method of ptychographic contrast reversal correction
Ultramicroscopy. 2024 Apr;258:113922. doi: 10.1016/j.ultramic.2024.113922. Epub 2024 Jan 8.ABSTRACTThe contrast transfer function of direct ptychography methods such as the single side band (SSB) method are single signed, yet these methods still sometimes exhibit contrast reversals, most often where the projected potentials are strong. In thicker samples central focusing often provides the best ptychographic contrast as this leads to defocus variations within the sample canceling out. However focusing away from the entrance surface is often undesirable as this degrades the annular dark field (ADF) signal. Here we discuss h...
Source: Ultramicroscopy - January 13, 2024 Category: Laboratory Medicine Authors: Christoph Hofer Chuang Gao Tamazouzt Chennit Biao Yuan Timothy J Pennycook Source Type: research
Point field emission electron source with a magnetically focused electron beam
Ultramicroscopy. 2024 Apr;258:113911. doi: 10.1016/j.ultramic.2023.113911. Epub 2023 Dec 21.ABSTRACTThis paper presents a field emitter in the form of a silicon tip covered with a layer of carbon nanotubes. The emitted beam is focused with a set of two electrostatic lenses and - which is novelty in such structures - with a magnetic field. The presented approach gave very promising results. The field emitter was able to provide a high emission current (about 50 µA) and a beam with a small and homogeneous spot. Such electron sources are necessary components of many miniature MEMS and nanoelectronics devices. The presented s...
Source: Ultramicroscopy - January 5, 2024 Category: Laboratory Medicine Authors: Pawe ł Urbański Piotr Szyszka Marcin Bia łas Tomasz Grzebyk Source Type: research
Point field emission electron source with a magnetically focused electron beam
Ultramicroscopy. 2023 Dec 21;258:113911. doi: 10.1016/j.ultramic.2023.113911. Online ahead of print.ABSTRACTThis paper presents a field emitter in the form of a silicon tip covered with a layer of carbon nanotubes. The emitted beam is focused with a set of two electrostatic lenses and - which is novelty in such structures - with a magnetic field. The presented approach gave very promising results. The field emitter was able to provide a high emission current (about 50 µA) and a beam with a small and homogeneous spot. Such electron sources are necessary components of many miniature MEMS and nanoelectronics devices. The pre...
Source: Ultramicroscopy - January 5, 2024 Category: Laboratory Medicine Authors: Pawe ł Urbański Piotr Szyszka Marcin Bia łas Tomasz Grzebyk Source Type: research
Point field emission electron source with a magnetically focused electron beam
Ultramicroscopy. 2023 Dec 21;258:113911. doi: 10.1016/j.ultramic.2023.113911. Online ahead of print.ABSTRACTThis paper presents a field emitter in the form of a silicon tip covered with a layer of carbon nanotubes. The emitted beam is focused with a set of two electrostatic lenses and - which is novelty in such structures - with a magnetic field. The presented approach gave very promising results. The field emitter was able to provide a high emission current (about 50 µA) and a beam with a small and homogeneous spot. Such electron sources are necessary components of many miniature MEMS and nanoelectronics devices. The pre...
Source: Ultramicroscopy - January 5, 2024 Category: Laboratory Medicine Authors: Pawe ł Urbański Piotr Szyszka Marcin Bia łas Tomasz Grzebyk Source Type: research
Point field emission electron source with a magnetically focused electron beam
Ultramicroscopy. 2023 Dec 21;258:113911. doi: 10.1016/j.ultramic.2023.113911. Online ahead of print.ABSTRACTThis paper presents a field emitter in the form of a silicon tip covered with a layer of carbon nanotubes. The emitted beam is focused with a set of two electrostatic lenses and - which is novelty in such structures - with a magnetic field. The presented approach gave very promising results. The field emitter was able to provide a high emission current (about 50 µA) and a beam with a small and homogeneous spot. Such electron sources are necessary components of many miniature MEMS and nanoelectronics devices. The pre...
Source: Ultramicroscopy - January 5, 2024 Category: Laboratory Medicine Authors: Pawe ł Urbański Piotr Szyszka Marcin Bia łas Tomasz Grzebyk Source Type: research
Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites
We describe a procedure for preparing such multi-component test samples containing E. coli bacteria and chitosan-coated hydrogenated nanodiamonds decorated with silver nanoparticles on a carbon-coated gold grid. Microscopic topography information (AFM) is combined with chemical, material, and morphological information (SEM using SE and BSE at varied acceleration voltages) from the same region of interest and processed to create 3D correlative probe-electron microscopy (CPEM) images. We also establish a novel 3D RGB color image algorithm for merging multiple SE/BSE data from SEM with the AFM surface topography data which pr...
Source: Ultramicroscopy - December 29, 2023 Category: Laboratory Medicine Authors: David Rutherford Kate řina Kolářová Jaroslav Čech Petr Hau šild Jaroslav Kuli ček Egor Ukraintsev Štěpán Stehlík Radek Dao Jan Neuman Bohuslav Rezek Source Type: research
Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites
We describe a procedure for preparing such multi-component test samples containing E. coli bacteria and chitosan-coated hydrogenated nanodiamonds decorated with silver nanoparticles on a carbon-coated gold grid. Microscopic topography information (AFM) is combined with chemical, material, and morphological information (SEM using SE and BSE at varied acceleration voltages) from the same region of interest and processed to create 3D correlative probe-electron microscopy (CPEM) images. We also establish a novel 3D RGB color image algorithm for merging multiple SE/BSE data from SEM with the AFM surface topography data which pr...
Source: Ultramicroscopy - December 29, 2023 Category: Laboratory Medicine Authors: David Rutherford Kate řina Kolářová Jaroslav Čech Petr Hau šild Jaroslav Kuli ček Egor Ukraintsev Štěpán Stehlík Radek Dao Jan Neuman Bohuslav Rezek Source Type: research
Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites
We describe a procedure for preparing such multi-component test samples containing E. coli bacteria and chitosan-coated hydrogenated nanodiamonds decorated with silver nanoparticles on a carbon-coated gold grid. Microscopic topography information (AFM) is combined with chemical, material, and morphological information (SEM using SE and BSE at varied acceleration voltages) from the same region of interest and processed to create 3D correlative probe-electron microscopy (CPEM) images. We also establish a novel 3D RGB color image algorithm for merging multiple SE/BSE data from SEM with the AFM surface topography data which pr...
Source: Ultramicroscopy - December 29, 2023 Category: Laboratory Medicine Authors: David Rutherford Kate řina Kolářová Jaroslav Čech Petr Hau šild Jaroslav Kuli ček Egor Ukraintsev Štěpán Stehlík Radek Dao Jan Neuman Bohuslav Rezek Source Type: research
Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites
We describe a procedure for preparing such multi-component test samples containing E. coli bacteria and chitosan-coated hydrogenated nanodiamonds decorated with silver nanoparticles on a carbon-coated gold grid. Microscopic topography information (AFM) is combined with chemical, material, and morphological information (SEM using SE and BSE at varied acceleration voltages) from the same region of interest and processed to create 3D correlative probe-electron microscopy (CPEM) images. We also establish a novel 3D RGB color image algorithm for merging multiple SE/BSE data from SEM with the AFM surface topography data which pr...
Source: Ultramicroscopy - December 29, 2023 Category: Laboratory Medicine Authors: David Rutherford Kate řina Kolářová Jaroslav Čech Petr Hau šild Jaroslav Kuli ček Egor Ukraintsev Štěpán Stehlík Radek Dao Jan Neuman Bohuslav Rezek Source Type: research
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection
In this study, we assess the efficacy of multiple generations of electron detectors for cross-correlation-based analysis using a single crystal Si sample as a reference. We show that, while improvements in precision are modest, there have been significant gains in the rate at which high-quality diffraction patterns can be collected. This has important implications in the size of datasets that can be collected and reduces the impact of drift and sample contamination.PMID:38141535 | DOI:10.1016/j.ultramic.2023.113913 (Source: Ultramicroscopy)
Source: Ultramicroscopy - December 23, 2023 Category: Laboratory Medicine Authors: Josephine DeRonja Matthew Nowell Stuart Wright Josh Kacher Source Type: research
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection
In this study, we assess the efficacy of multiple generations of electron detectors for cross-correlation-based analysis using a single crystal Si sample as a reference. We show that, while improvements in precision are modest, there have been significant gains in the rate at which high-quality diffraction patterns can be collected. This has important implications in the size of datasets that can be collected and reduces the impact of drift and sample contamination.PMID:38141535 | DOI:10.1016/j.ultramic.2023.113913 (Source: Ultramicroscopy)
Source: Ultramicroscopy - December 23, 2023 Category: Laboratory Medicine Authors: Josephine DeRonja Matthew Nowell Stuart Wright Josh Kacher Source Type: research
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection
In this study, we assess the efficacy of multiple generations of electron detectors for cross-correlation-based analysis using a single crystal Si sample as a reference. We show that, while improvements in precision are modest, there have been significant gains in the rate at which high-quality diffraction patterns can be collected. This has important implications in the size of datasets that can be collected and reduces the impact of drift and sample contamination.PMID:38141535 | DOI:10.1016/j.ultramic.2023.113913 (Source: Ultramicroscopy)
Source: Ultramicroscopy - December 23, 2023 Category: Laboratory Medicine Authors: Josephine DeRonja Matthew Nowell Stuart Wright Josh Kacher Source Type: research
