Focused ion beam for improved spatially-resolved mass spectrometry and analysis of radioactive materials for uranium isotopic analysis.

Focused ion beam for improved spatially-resolved mass spectrometry and analysis of radioactive materials for uranium isotopic analysis. Talanta. 2020 May 01;211:120720 Authors: Reilly DD, Beck CL, Buck EC, Cliff JB, Duffin AM, Lach TG, Liezers M, Springer KW, Tedrow SJ, Zimmer MM Abstract The ability to acquire high-quality spatially-resolved mass spectrometry data is sought in many fields of study, but it often comes with high cost of instrumentation and a high level of expertise required. In addition, techniques highly regarded for isotopic analysis applications such as thermal ionization mass spectrometry (TIMS) do not have the ability to acquire spatially-resolved data. Another drawback is that for radioactive materials, which are often of interest for isotopic analysis in geochemistry and nuclear forensics applications, high-end instruments often have restrictions on radioactivity and non-dispersibility requirements. We have applied the use of a traditional microanalysis tool, the focused ion beam/scanning electron microscope (FIB/SEM), for preparation of radioactive materials either for direct analysis by spatially-resolved instruments such as secondary ion mass spectrometry (SIMS) and laser ablation inductively-coupled mass spectrometry (LA-ICP-MS), or similarly to provide some level of spatial resolution to techniques that do not inherently have that ability such as TIMS or quadrupole inductively coupled plasma mass spectrome...
Source: Talanta - Category: Chemistry Authors: Tags: Talanta Source Type: research