Decreased 8-oxoguanine DNA glycosylase 1 (hOGG1) expression and DNA oxidation damage induced by Cr (VI)

Publication date: Available online 27 November 2018Source: Chemico-Biological InteractionsAuthor(s): Hailing Xia, Shibo Ying, Lingfang Feng, Haiming Wang, Chunji Yao, Tao Li, Yixiao Zhang, Sanjun Fu, Donger Ding, Xinnian Guo, Yan Tong, Xiaofeng Wang, Zhijian Chen, Zhaoqiang Jiang, Xing Zhang, Bernardo Lemos, Jianlin LouAbstractOccupational exposure to Cr (VI) can cause DNA damage, genetic instability and elevate the risk of cancer. Here we investigated Cr (VI)-induced DNA damage and 8-oxoguanine DNA glycosylase 1 (hOGG1) gene expression in electroplating workers. The hOGG1 gene encodes a DNA repair enzyme that is crucial in DNA oxidation damage repair. Deficiency in hOGG1 DNA repair capacity contributes to the accumulation of DNA damage and genetic instability. To address the issues, we collected peripheral blood samples and urine samples from 162 electroplating workers and 84 control subjects. We measured blood chromium levels, urine chromium levels, DNA damage, and hOGG1 mRNA expression. We found significantly higher levels of blood chromium, urine chromium, and DNA damage in electroplating workers compared with controls, whereas mRNA levels of the hOGG1 gene were significantly lower in the exposed workers. Furthermore, in electroplating workers we found that blood Cr had a positive association with DNA damage as measured with the tail DNA%. Meanwhile, tail DNA% was positively associated with hOGG1 mRNA expression. Finally, the effect of potassium dichromate treatment was i...
Source: Chemico Biological Interactions - Category: Biochemistry Source Type: research