Scanning force microscope for in situ nanofocused X-ray diffraction studies
A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X-ray diffraction. This in situ approach gives access to the mechanical behavior of nanomaterials.
Source: Journal of Synchrotron Radiation - Category: Physics Authors: Ren, Z.Mastropietro, F.Davydok, A.Langlais, S.Richard, M.-Furter, J.-J.Thomas, O.Dupraz, M.Verdier, M.Beutier, G.Boesecke, P.Cornelius, T.W. Tags: in situ atomic force microscopy nanofocused X-ray diffraction mechanical properties nanostructure research papers Source Type: research