Design and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-II

A hard X-ray scanning microscope installed at the Hard X-ray Nanoprobe beamline of the National Synchrotron Light Source II has been designed, constructed and commissioned. The microscope relies on a compact, high stiffness, low heat dissipation approach and utilizes two types of nanofocusing optics. It is capable of imaging with ∼ 15   nm × 15   nm spatial resolution using multilayer Laue lenses and 25   nm × 26   nm resolution using zone plates. Fluorescence, diffraction, absorption, differential phase contrast, ptychography and tomography are available as experimental techniques. The microscope is also equipped with a temperature regulation system which allows the temperature of a sample to be varied in the range between 90   K and 1000   K. The constructed instrument is open for general users and offers its capabilities to the material science, battery research and bioscience communities.
Source: Journal of Synchrotron Radiation - Category: Physics Authors: Tags: X-ray microscopy multilayer Laue lenses nanoprobes research papers Source Type: research