Genes, Vol. 15, Pages 583: Mapping of Leaf Rust Resistance Loci in Two Kenyan Wheats and Development of Linked Markers

Genes, Vol. 15, Pages 583: Mapping of Leaf Rust Resistance Loci in Two Kenyan Wheats and Development of Linked Markers Genes doi: 10.3390/genes15050583 Authors: Davinder Singh Peace Kankwatsa Karanjeet S. Sandhu Urmil K. Bansal Kerrie L. Forrest Robert F. Park Leaf rust caused by the pathogen Puccinia triticina (Pt) is a destructive fungal disease of wheat that occurs in almost all wheat-growing areas across the globe. Genetic resistance has proven to be the best solution to mitigate the disease. Wheat breeders are continuously seeking new diversified and durable sources of resistance to use in developing new varieties. We developed recombinant inbred line (RIL) populations from two leaf rust-resistant genotypes (Kenya Kudu and AUS12568) introduced from Kenya to identify and characterize resistance to Pt and to develop markers linked closely to the resistance that was found. Our studies detected four QTL conferring adult plant resistance (APR) to leaf rust. Two of these loci are associated with known genes, Lr46 and Lr68, residing on chromosomes 1B and 7B, respectively. The remaining two, QLrKK_2B and QLrAus12568_5A, contributed by Kenya Kudu and AUS12568 respectively, are putatively new loci for Pt resistance. Both QLrKK_2B and QLrAus12568_5A were found to interact additively with Lr46 in significantly reducing the disease severity at adult plant growth stages in the field. We further developed a suite of six closely linked markers within the QLrAus12568_5A...
Source: Genes - Category: Genetics & Stem Cells Authors: Tags: Article Source Type: research