Electrical storm after left ventricular assist device (LVAD) implantation
ConclusionFollowing LVAD implantation, the rate of ES was 7% with majority of ES occurring within 30 days of LVAD. Risk factors for ES included pre-implant history of ventricular arrhythmias and ICD shock. ES was significantly associated with reduced survival compared to patients without ES.
Source: Journal of Cardiovascular Electrophysiology - Category: Cardiology Authors: Suganya Karikalan,
Min Choon Tan,
Nan Zhang,
Hicham El ‐Masry,
Ammar M. Killu,
Christopher V. DeSimone,
Abhishek J. Deshmukh,
Christopher J. McLeod,
Dan Sorajja,
Komandoor Srivathsan,
Luis Scott,
Yong‐Mei Cha,
Justin Z. Lee Tags: ORIGINAL ARTICLE Source Type: research