Test-retest reliability of the Virtual Reality Sickness Evaluation using Electroencephalography (EEG)

Publication date: Available online 24 December 2020Source: Neuroscience LettersAuthor(s): Hyun Kyoon Lim, Kyungha Ji, Ye Shin Woo, Dong-uk Han, Dong-Hyun Lee, Sun Gu Nam, Kyoung-Mi Jang
Source: Neuroscience Letters - Category: Neuroscience Source Type: research