Resonant X-ray emission spectroscopy using self-seeded hard X-ray pulses at PAL-XFEL
Self-seeded hard X-ray pulses at PAL-XFEL were used to commission a resonant X-ray emission spectroscopy experiment with a von Hamos spectrometer. The self-seeded beam, generated through forward Bragg diffraction of the [202] peak in a 100 µ m-thick diamond crystal, exhibited an average bandwidth of 0.54 eV at 11.223 keV. A coordinated scanning scheme of electron bunch energy, diamond crystal angle and silicon monochromator allowed us to map the Ir L β 2 X-ray emission lines of IrO2 powder across the Ir L3-absorption edge, from 11.212 to 11.242 keV with an energy step of 0.3 eV. This work provides a reference for hard X-ray emission spectroscopy experiments utilizing self-seeded pulses with a narrow bandwidth, eventually applicable for pump – probe studies in solid-state and diluted systems.
Source: Journal of Synchrotron Radiation - Category: Physics Authors: Choi, T.-K. Park, J. Kim, G. Jang, H. Park, S.-Y. Sohn, J.H. Cho, B.I. Kim, H. Kim, K.S. Nam, I. Chun, S.H. Tags: X-ray free-electron laser (XFEL) self-seeding resonant X-ray emission spectroscopy (RXES) von Hamos spectrometer research papers Source Type: research