Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers

The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.

Source: Journal of Synchrotron Radiation - October 16, 2017 Category: Physics Authors: Wiedorn, M.O. Awel, S. Morgan, A.J. Barthelmess, M. Bean, R. Beyerlein, K.R. Chavas, L.M.G. Eckerskorn, N. Fleckenstein, H. Heymann, M. Horke, D.A. Kno š ka, J. Mariani, V. Oberth ü r, D. Roth, N. Yefanov, O. Barty, A. Bajt, S. K ü pper, J. Rode, A.V. Tags: X-ray diffraction single-particle imaging coherent diffractive imaging aperture background scattering signal-to-noise ratio laboratory notes Source Type: research