Relation between sampling, sensitivity and precision in strain mapping using the Geometric Phase Analysis method in Scanning Transmission Electron Microscopy

In this study an additional parameter, sampling, is proposed to be analyzed regarding the precision of GPA by developing the concept of a phase noise in the GPA equations. Both experimentally and theoretically, the following article demonstrates how the precision, and the sensitivity of the GPA method is improved when using a larger pixel spacing to record an electron micrograph in Scanning Transmission Electron Microscopy (STEM). The counterintuitive concept of increasing the field of view to improve the GPA precision results is an extension of the application of strain characterization methods in STEM towards low deformation levels.PMID:37690294 | DOI:10.1016/j.ultramic.2023.113842
Source: Ultramicroscopy - Category: Laboratory Medicine Authors: Source Type: research