High-resolution XEOL spectroscopy setup at the X-ray absorption spectroscopy beamline P65 of PETRA III

A newly designed setup to perform steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous XEOL and X-ray absorption spectroscopy characterization at beamline P65 of PETRA III is described. The XEOL setup is equipped with a He-flow cryostat and state-of-the-art optical detection system, which covers a wide wavelength range of 300 – 1700   nm with a high spectral resolution of 0.4   nm. To demonstrate the setup functioning, low-temperature XEOL studies on polycrystalline CuInSe2 thin film, single-crystalline GaN thin film and single-crystalline ZnO bulk semiconductor samples are performed.

Source: Journal of Synchrotron Radiation - August 11, 2022 Category: Physics Authors: Levcenko, S. Biller, R. Pfeiffelmann, T. Ritter, K. Falk, H.H. Wang, T. Siebentritt, S. Welter, E. Schnohr, C.S. Tags: XEOL XAS CuInSe2 ZnO GaN research papers Source Type: research