A new Kirkpatrick – Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II

The development, construction, and first commissioning results of a new scanning microscope installed at the 5-ID Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II are reported. The developed system utilizes Kirkpatrick – Baez mirrors for X-ray focusing. The instrument is designed to enable spectromicroscopy measurements in 2D and 3D with sub-200   nm spatial resolution. The present paper focuses on the design aspects, optical considerations, and specifics of the sample scanning stage, summarizing some of the initial commissioning results.

Source: Journal of Synchrotron Radiation - July 29, 2022 Category: Physics Authors: Nazaretski, E. Coburn, D.S. Xu, W. Ma, J. Xu, H. Smith, R. Huang, X. Yang, Y. Huang, L. Idir, M. Kiss, A. Chu, Y.S. Tags: X-ray microscopy KB optics X-ray microscopy instrumentation beamlines Source Type: research