High-resolution detection of quantitative trait loci for seven important yield-related traits in wheat (Triticum aestivum L.) using a high-density SLAF-seq genetic map
Yield-related traits including thousand grain weight (TGW), grain number per spike (GNS), grain width (GW), grain length (GL), plant height (PH), spike length (SL), and spikelet number per spike (SNS) are grea...
Source: BMC Genetics - Category: Genetics & Stem Cells Authors: Tao Li, Qiao Li, Jinhui Wang, Zhao Yang, Yanyan Tang, Yan Su, Juanyu Zhang, Xvebing Qiu, Xi Pu, Zhifen Pan, Haili Zhang, Junjun Liang, Zehou Liu, Jun Li, Wuyun Yan, Maoqun Yu & hellip; Tags: Research Source Type: research