In situ AP-XPS analysis of a Pt thin-film sensor for highly sensitive H2 detection.

In situ AP-XPS analysis of a Pt thin-film sensor for highly sensitive H2 detection.
Chem Commun (Camb). 2020 Jul 31;:
Authors: Toyoshima R, Tanaka T, Kato T, Uchida K, Kondoh H
Abstract
In situ ambient-pressure X-ray photoelectron spectroscopy (AP-XPS) combined with resistivity measurement was performed for a Pt thin-film H2 gas sensor. We experimentally demonstrate that the chemical state of the Pt surface changes under working conditions, and it directly links to the sensing performance. Moreover, the operating principle is discussed at the atomic scale.
PMID: 32734986 [PubMed - as supplied by publisher]

Source: Chemical Communications - July 30, 2020 Category: Chemistry Authors: Toyoshima R, Tanaka T, Kato T, Uchida K, Kondoh H Tags: Chem Commun (Camb) Source Type: research