Determination of X-ray pulse duration via intensity correlation measurements of X-ray fluorescence

A simple method using X-ray fluorescence is proposed to diagnose the duration of an X-ray free-electron laser (XFEL) pulse. This work shows that the degree of intensity correlation of the X-ray fluorescence generated by irradiating an XFEL pulse on metal foil reflects the magnitude relation between the XFEL duration and the coherence time of the fluorescence. Through intensity correlation measurements of copper K α fluorescence, the duration of 12   keV XFEL pulses from SACLA was evaluated to be ∼ 10   fs.

Source: Journal of Synchrotron Radiation - September 22, 2019 Category: Physics Authors: Inoue, I. Tamasaku, K. Osaka, T. Inubushi, Y. Yabashi, M. Tags: X-ray free-electron lasers intensity correlation X-ray fluorescence short communications Source Type: research