Orientation mapping of graphene in a scanning electron microscope

Publication date: August 2019Source: Carbon, Volume 149Author(s): Benjamin W. Caplins, Jason D. Holm, Robert R. KellerAbstractA scanning transmission electron diffraction method is developed for use in the scanning electron microscope to perform orientational characterization of 2D materials. The method can generate orientation maps of monolayer graphene over a field of view up to ≈50μm in just a few minutes and can distinguish twisted bilayers from aligned bilayers. This method holds promise to bring electron-diffraction-based orientation measurements of 2D materials to a broader audience.Graphical abstract
Source: Carbon - Category: Materials Science Source Type: research