Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers

For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick – Baez mirror chamber with the detectors located above the vertically reflecting mirror. The linearity, noise and position sensitivity of the detectors have been characterized. The photodiode responsivity is suitable for high pulse energies. The microchannel plate detector shows sufficient responsivity over a wide range of pulse energies. The relative signal from the two photodiodes provides a sensitive measure of the X-ray beam position. The fluorescence intensity monitor provides intensity normalization while being compatible with high incident power, a 0.93   MHz repetition rate and ultra-high vacuum.

Source: Journal of Synchrotron Radiation - February 22, 2019 Category: Physics Authors: Heimann, P. Reid, A. Feng, Y. Fritz, D. Tags: X-ray intensity monitor diagnostics X-ray free-electron laser research papers Source Type: research