Correcting for surface topography in X-ray fluorescence imaging

Samples with non-planar surfaces present challenges for X-ray fluorescence imaging analysis. Here, approximations are derived to describe the modulation of fluorescence signals by surface angles and topography, and suggestions are made for reducing this effect. A correction procedure is developed that is effective for trace element analysis of samples having a uniform matrix, and requires only a fluorescence map from a single detector. This procedure is applied to fluorescence maps from an incised gypsum tablet.

Source: Journal of Synchrotron Radiation - October 9, 2014 Category: Physics Authors: Geil, E.C.Thorne, R.E. Tags: X-ray fluorescence imaging surface angle surface orientation topography research papers Source Type: research