A setup for synchrotron-radiation-induced total reflection X-ray fluorescence and X-ray absorption near-edge structure recently commissioned at BESSY II BAMline

An automatic sample changer chamber for total reflection X-ray fluorescence (TXRF) and X-ray absorption near-edge structure (XANES) analysis in TXRF geometry was successfully set up at the BAMline at BESSY II. TXRF and TXRF-XANES are valuable tools for elemental determination and speciation, especially where sample amounts are limited (

Source: Journal of Synchrotron Radiation - March 22, 2016 Category: Physics Authors: Fittschen, U.Guilherme, A.Böttger, S.Rosenberg, D.Menzel, M.Jansen, W.Busker, M.Gotlib, Z.P.Radtke, M.Riesemeier, H.Wobrauschek, P.Streli, C. Tags: TXRF TXRF-XANES sample changer BAMline Re-XANES short communications Source Type: research