Repeatability of epithelium thickness measured by an AS-OCT in different grades keratoconus and compared to AS-OCT/Placido topography

To compare agreement of corneal epithelium thickness (ET) between AS-OCT system (RTVue, Optovue, Fremont, USA) and AS-OCT/Placido topographer (MS-39, CSO, Florence, Italy) in different stages keratoconus (KC) eyes, and to assess the repeatability of RTVue AS-OCT.
Source: American Journal of Ophthalmology - Category: Opthalmology Authors: Tags: Original Articles Source Type: research