Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.

Source: Journal of Synchrotron Radiation - June 27, 2015 Category: Physics Authors: Ketenoglu, D.Harder, M.Klementiev, K.Upton, M.Taherkhani, M.Spiwek, M.Dill, F.-U.Wille, H.-C.Yavaş, H. Tags: resonant inelastic X-ray scattering (RIXS) high energy-resolution diced crystal analyzers quartz research papers Source Type: research