[ASAP] In Situ Radiation Hardness Study of Amorphous Zn –In–Sn–O Thin-Film Transistors with Structural Plasticity and Defect Tolerance

ACS Applied Materials& InterfacesDOI: 10.1021/acsami.3c06555

Source: ACS Applied Materials and Interfaces - July 5, 2023 Category: Materials Science Authors: Dongil Ho, Sunwoo Choi, Hyunwoo Kang, Byungkyu Park, Minh Nhut Le, Sung Kyu Park, Myung-Gil Kim, Choongik Kim, and Antonio Facchetti Source Type: research