Pattern-onset and OFFset visual evoked potentials in the diagnosis of hemianopic field defects

ConclusionOur findings show how extending the recording time window to include an OFFset VEP facilitates identification of hemianopic visual field defects. We advocate the pattern-onset/OFFset VEP in the assessment of patients with hemianopia, having particular value for patients who are otherwise unable to perform more demanding half-field electrophysiology, imaging or psychophysical testing.

Source: Documenta Ophthalmologica - July 19, 2020 Category: Opthalmology Source Type: research