[ASAP] A Critical Review of Thermal Boundary Conductance across Wide and Ultrawide Bandgap Semiconductor Interfaces
ACS Applied Materials& InterfacesDOI: 10.1021/acsami.3c02507
Source: ACS Applied Materials and Interfaces - Category: Materials Science Authors: Tianli Feng, Hao Zhou, Zhe Cheng, Leighann Sarah Larkin, and Mahesh R. Neupane Source Type: research
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