Efficient surface defect identification for optical components via multi-scale mixed Kernels and structural re-parameterization
Surface defect identification plays a vital role in defective component rapid screening tasks in optics-related industries. However, the ...
Source: Journal of the Optical Society of America A - Category: Physics Authors: Xiao Liang Hancen Zhen Xuewei Wang Jie Li Yanjun Han Jingbo Guo Source Type: research
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