Polarized light diffuse reflectance FT-NIR MEMS spectrometer enabling the detection of powder samples through a thin plastic layer
Polarized scattered light Fourier transform infrared (FTIR) spectroscopy is used for measuring the absorbance of highly scattering ...
Source: Journal of the Optical Society of America A - Category: Physics Authors: Yomna M. Eltagoury Yasser M. Sabry Diaa Khalil Source Type: research
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