Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM).

Source: BMC Ophthalmology - July 14, 2021 Category: Opthalmology Authors: Juan Gros-Otero, Samira Ketabi, Rafael Ca ñones-Zafra, Montserrat Garcia-Gonzalez, Cesar Villa-Collar, Santiago Casado and Miguel A. Teus Tags: Research Source Type: research