Marker-free stitching deflectometry for three-dimensional measurement of the specular surface
Due to the ‘ invisible ’ property of the specular surface, it is difficult for the stitching deflectometry to identify the ...
Source: Optics Express - Category: Physics Authors: Ruiyang Wang Dahai Li Xinwei Zhang Wanxing Zheng Linzhi Yu Renhao Ge Source Type: research
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