Towards RIP using free-electron laser SFX data

Here, it is shown that simulated native serial femtosecond crystallography (SFX) cathepsin B data can be phased by rapid ionization of sulfur atoms. Utilizing standard software adopted for radiation-damage-induced phasing (RIP), the effects on both substructure determination and phasing of the number of collected patterns and fluences are explored for experimental conditions already available at current free-electron laser facilities.

Source: Journal of Synchrotron Radiation - February 5, 2015 Category: Physics Authors: Galli, L.Son, S.-K.White, T.A.Santra, R.Chapman, H.N.Nanao, M.H. Tags: X-ray FEL phasing radiation damage SFX research papers Source Type: research