Evaluation of a Commercial Off The Shelf CMOS Image Sensor for X-ray spectroscopy up to 24.9 keV

Publication date: December 2020Source: Radiation Physics and Chemistry, Volume 177Author(s): Martín Pérez, Miguel Sofo Haro, José Lipovetzky, Andres Cicuttin, María Liz Crespo, Fabricio Alcade Bessia, Mariano Gómez Berisso, Juan Jerónimo Blostein

Source: Radiation Physics and Chemistry - August 19, 2020 Category: Physics Source Type: research