Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence

This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, and the beam size evaluated using the proposed method was consistent with that measured using the knife-edge scan method. The proposed method is readily applicable to extremely small X-ray spots and can be applied for the precise diagnostics of sub-10   nm focused X-ray beams which have recently emerged.

Source: Journal of Synchrotron Radiation - August 16, 2020 Category: Physics Authors: Nakamura, N. Matsuyama, S. Inoue, T. Inoue, I. Yamada, J. Osaka, T. Yabashi, M. Ishikawa, T. Yamauchi, K. Tags: Intensity correlation X-ray focusing focus characterization X-ray fluorescence X-ray free-electron lasers SACLA short communications Source Type: research