A randomized in vitro evaluation of transient and permanent cardiac implantable electronic device malfunctions following direct exposure up to 10 Gy

ConclusionApart from transient electromagnetic interference, last-generation CIEDs withstood direct 6 ‑MV exposure up to 10 Gy. Permanent battery or software errors occurred immediately or later only in less recent CIEDs.

http://link.springer.com/10.1007/s00066-020-01651-7

Source: Strahlentherapie und Onkologie - June 18, 2020 Category: Cancer & Oncology Source Type: research

A randomized in vitro evaluation of transient and permanent cardiac implantable electronic device malfunctions following direct exposure up to 10 Gy

A randomized in vitro evaluation of transient and permanent cardiac implantable electronic device malfunctions following direct exposure up to 10 Gy