Structural and electrical characteristics of high-performance stacked YbTixOy/PbZr0.53Ti0.47O3 gate dielectrics for InGaZnO thin-film transistors

Publication date: Available online 30 May 2020Source: Journal of Alloys and CompoundsAuthor(s): Tung-Ming Pan, Hung-Chun Wang, Jim-Long Her

Source: Journal of Alloys and Compounds - June 1, 2020 Category: Chemistry Source Type: research