Spatial pattern-shifting method for complete two-wavelength fringe projection profilometry

Two-wavelength fringe projection profilometry (FPP) unwraps a phase with the unambiguous phase range (UPR) of the least common multiple ...

Source: Optics Letters - May 27, 2020 Category: Physics Authors: Chu Lin Dongliang Zheng Qian Kemao Jing Han Lianfa Bai Source Type: research