Resolution enhancement in an extended depth of field for volumetric two-photon microscopy

The resolution enhancement over the extended depth of field (DOF) in the volumetric two-photon microscopy (TPM) is demonstrated by ...

Source: Optics Letters - May 26, 2020 Category: Physics Authors: Hongsen He Cihang Kong Ka Yan Chan W. L. So Hiu Ka Fok Yu-Xuan Ren Cora S. W. Lai Kevin K. Tsia Kenneth K. Y. Wong Source Type: research