Effect of surface contamination on XANES analysis of DLC films

Publication date: Available online 4 February 2020Source: Radiation Physics and ChemistryAuthor(s): Jidapa Lomon, Thanit Saisopa, Phitsanu Poolcharuansin, Nitisak Pasaja, Artit Chingsungnoen, Ratchadaporn Supruangnet, Hideki Nakajima, Narong Chanlek, Prayoon SongsiriritthigulAbstractThe effect of adventitious contamination on total-electron-yield XANES analyses of carbon species of diamond-like carbon (DLC) films was investigated. XPS and XANES measurements on a DLC sample with different amounts of contamination were carried out in the same analysis chamber. The amount of contamination was adjusted by 0.5-keV Ar-ion sputtering. The sp2-bonded atoms deduced from the XANES spectra was found to vary with amount of the surface contamination. Bombardment DLC films with 0.5-keV Ar ions might cause damage to the sp2 hybridization in DLC.

Source: Radiation Physics and Chemistry - February 5, 2020 Category: Physics Source Type: research