Dual-axis optical spatial heterodyning angle measurements using CMOS sensor color crosstalk

Publication date: Available online 22 January 2020Source: Sensors and Actuators A: PhysicalAuthor(s): James Leibold, Ribal Georges SabatAbstractA simple, yet precise, optical angle measurement device was developed by analyzing the light interference pattern from a modified Lloyd’s mirror interferometer combined with a CMOS camera sensor. The resulting spatially heterodyned signal was very sensitive to small angle changes from an incident low-power laser beam, with an accuracy better than 8.9 arcsec over a range of 1.47 degrees. Measurement dead zones, estimated to have an angular span of ± 0.96 arcmin, occurred in the middle of the device’s measurement range at a critical angle where the pitches of the light interference pattern and the CMOS sensor array were equal. Also, a proof-of-concept test successfully demonstrated the use of this device for dual-axis angle measurements using a single CMOS sensor.Graphical abstract
Source: Sensors and Actuators A: Physical - Category: Physics Source Type: research
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