Far- and deep-ultraviolet surface plasmon resonance using Al film for efficient sensing of organic thin overlayer

In this study, organic thin films were formed on the Al films, and their surface plasmon resonance (SPR) wavelengths were measured by our original attenuated total reflectance spectroscopic system. With an increase in the organic film thickness, the SPR wavelength shifted to longer wavelengths. The minimum detection thickness of the organic overlayer reached 2 nm for three Al films under different conditions (i.e., different Al thickness and oxidation effects), and the spectra were reproduced by simulations based on the Fresnel equations. These results showed the practical advantage of the Al-based SPR sensor without accurate control of the chemical state of the Al film.Graphical abstract
Source: Sensors and Actuators A: Physical - Category: Physics Source Type: research

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Source: Annals of Allergy, Asthma and Immunology - Category: Allergy & Immunology Source Type: research
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Source: Annals of Allergy, Asthma and Immunology - Category: Allergy & Immunology Source Type: research
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