Sensors, Vol. 19, Pages 4046: Geometric Aberration Theory of Offner Imaging Spectrometers
Sensors, Vol. 19, Pages 4046: Geometric Aberration Theory of Offner Imaging Spectrometers
Sensors doi: 10.3390/s19184046
Authors:
Meihong Zhao
Yanxiu Jiang
Shuo Yang
Wenhao Li
A third-order aberration theory has been developed for the Offner imaging spectrometer comprising an extended source; two concave mirrors; a convex diffraction grating; and an image plane. Analytic formulas of the spot diagram are derived for tracing rays through the system based on Fermat’s principle. The proposed theory can be used to discuss in detail individual aberrations of the system such as coma, spherical aberration and astigmatism, and distortion together with the focal conditions. It has been critically evaluated as well in a comparison with exact ray tracing constructed using the commercial software ZEMAX. In regard to the analytic formulas, the results show a high degree of practicality.
Source: Sensors - Category: Biotechnology Authors: Meihong Zhao Yanxiu Jiang Shuo Yang Wenhao Li Tags: Article Source Type: research
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