Versatile inversion tool for phaseless optical diffraction: tomography

Estimating three-dimensional complex permittivity of a sample from the intensity recorded at the image plane of a microscope for various angles of illumination, as in optical Fourier ptychography microscopy, permits one to avoid the interferometric measurements of classical tomographic diffraction ...
Source: Journal of the Optical Society of America A - Category: Physics Authors: Source Type: research
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