X-ray diffraction reveals blunt-force loading threshold for nanoscopic structural change in ex   vivo neuronal tissues

In this study, we make use of the fact that changes in the structure and periodicity of myelin may indicate neurological damage and can be detected with X-ray diffraction (XRD). XRD allows access to a nanoscopic resolution range not readily achieved by alternative methods, nor does the experimental methodology require chemical sample fixation. In this study, XRD was used to evaluate the affects of controlled mechanical loading on myelin packing structure in ex vivo optic nerve samples. By using a series of crush tests on isolated optic nerves a quantified baseline for mechanical load was found to induce changes in the packing structure of myelin. To the authors' knowledge, this is the first report of its kind.
Source: Journal of Synchrotron Radiation - Category: Physics Authors: Tags: blunt-force ex vivo myelin loading X-ray diffraction research papers Source Type: research