Electrical detection of trace zinc ions with an extended gate-AlGaN/GaN high electron mobility sensor

In this report, we have developed a high sensitivity zinc ion (Zn2+) detection method based on a Schiff base functionalized extended gate (EG)-AlGaN/GaN high electron mobility (HEMT) sensor. To cite this article before page numbers are assigned, use the DOI form of citation above. The content of this RSS Feed (c) The Royal Society of Chemistry

Source: RSC - Analyst latest articles - November 29, 2018 Category: Chemistry Authors: Le Gu Source Type: research