X-ray phase-contrast imaging with engineered porous materials over 50   keV

X-ray phase-contrast imaging can substantially enhance image contrast for weakly absorbing samples. The fabrication of dedicated optics remains a major barrier, especially in high-energy regions (i.e. over 50   keV). Here, the authors perform X-ray phase-contrast imaging by using engineered porous materials as random absorption masks, which provides an alternative solution to extend X-ray phase-contrast imaging into previously challenging higher energy regions. The authors have measured various samples to demonstrate the feasibility of the proposed engineering materials. This technique could potentially be useful for studying samples across a wide range of applications and disciplines.

Source: Journal of Synchrotron Radiation - June 12, 2018 Category: Physics Authors: Wang, H. Cai, B. Pankhurst, M.J. Zhou, T. Kashyap, Y. Atwood, R. Le Gall, N. Lee, P. Drakopoulos, M. Sawhney, K. Tags: X-ray phase imaging speckle technique hard X-rays random attenuation masks high-energy regions porous materials research papers Source Type: research