Factor structure of the positive and negative syndrome scale (PANSS) in people at ultra high risk (UHR) for psychosis

The Positive and Negative Syndrome Scale (PANSS), a comprehensive psychopathology assessment scale used in the evaluation of psychopathology in schizophrenia, is also often used in the Ultra-High-Risk (UHR) population. This paper examined the dimensional structure of the PANSS in a UHR sample.

Source: Schizophrenia Research - May 24, 2018 Category: Psychiatry Authors: Zixu Yang, Keane Lim, Max Lam, Richard Keefe, Jimmy Lee Source Type: research